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Atomic layer deposition of metal oxides for efficient perovskite single-junction and perovskite/silicon tandem solar cells.
Hossain, Mohammad I; Mohammad, Adnan; Qarony, Wayesh; Ilhom, Saidjafarzoda; Shukla, Deepa R; Knipp, Dietmar; Biyikli, Necmi; Tsang, Yuen Hong.
Afiliação
  • Hossain MI; Department of Applied Physics, The Hong Kong Polytechnic University Hung Hom Kowloon Hong Kong yuen.tsang@polyu.edu.hk.
  • Mohammad A; Department of Electrical and Computer Engineering, University of Connecticut Storrs CT 06269 USA necmi.biyikli@uconn.edu.
  • Qarony W; Department of Electrical and Computer Engineering, University of Connecticut Storrs CT 06269 USA necmi.biyikli@uconn.edu.
  • Ilhom S; Department of Applied Physics, The Hong Kong Polytechnic University Hung Hom Kowloon Hong Kong yuen.tsang@polyu.edu.hk.
  • Shukla DR; Department of Electrical and Computer Engineering, University of Connecticut Storrs CT 06269 USA necmi.biyikli@uconn.edu.
  • Knipp D; Department of Electrical and Computer Engineering, University of Connecticut Storrs CT 06269 USA necmi.biyikli@uconn.edu.
  • Biyikli N; Department of Materials Science and Engineering, University of Connecticut Storrs CT 06269 USA.
  • Tsang YH; Geballe Laboratory for Advanced Materials, Department of Materials Science and Engineering, Stanford University Stanford CA 94305 USA dknipp@stanford.edu.
RSC Adv ; 10(25): 14856-14866, 2020 Apr 08.
Article em En | MEDLINE | ID: mdl-35497161
ABSTRACT
Aluminum-doped and undoped zinc oxide films were investigated as potential front and rear contacts of perovskite single and perovskite/silicon tandem solar cells. The films were prepared by atomic layer deposition (ALD) at low (<200 °C) substrate temperatures. The deposited films were crystalline with a single-phase wurtzite structure and exhibit excellent uniformity and low surface roughness which was confirmed by XRD and SEM measurements. Necessary material characterizations allow for realizing high-quality films with low resistivity and high optical transparency at the standard growth rate. Spectroscopic ellipsometry measurements were carried out to extract the complex refractive index of the deposited films, which were used to study the optics of perovskite single junction and perovskite/silicon tandem solar cells. The optics was investigated by three-dimensional finite-difference time-domain simulations. Guidelines are provided on how to realize perovskite solar cells exhibiting high short-circuit current densities. Furthermore, detailed guidelines are given for realizing perovskite/silicon tandem solar cells with short-circuit current densities exceeding 20 mA cm-2 and potential energy conversion efficiencies beyond 31%.

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2020 Tipo de documento: Article

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2020 Tipo de documento: Article