Managing technostress in the STEM world.

Murray, Sandra A; Shuler, Haysetta D; Davis, Jamaine S; Spencer, Elsie C; Hinton, Antentor O

Murray, Sandra A; Shuler, Haysetta D; Davis, Jamaine S; Spencer, Elsie C; Hinton, Antentor O.

Afiliação

Murray SA; Department of Cell Biology, University of Pittsburgh; Pittsburgh, PA 15261, USA. Electronic address: smurray@pitt.edu.
Shuler HD; Department of Biological Sciences, Winston-Salem State University, Winston-Salem, NC 27110, USA; Shuler Consulting, LLC, Winston-Salem, NC 27110, USA. Electronic address: shulerh@wssu.edu.
Davis JS; Department of Biochemistry, Cancer Biology, Neuroscience, and Pharmacology, Meharry Medical College, Nashville, TN 37208, USA.
Spencer EC; Teachers College, Columbia University; New York, NY 10027, USA; Department of Molecular Physiology and Biophysics, Vanderbilt University; Nashville, TN 37232, USA.
Hinton AO; Department of Molecular Physiology and Biophysics, Vanderbilt University; Nashville, TN 37232, USA. Electronic address: antentor.o.hinton.jr@vanderbilt.edu.

Trends Biotechnol ; 40(8): 903-906, 2022 08.

Article em En | MEDLINE | ID: mdl-35644774

Assuntos

Tecnologia; Humanos; Matemática

Palavras-chave

techno-complexity; techno-insecurity; techno-invasion; techno-overload; techno-unreliability; technostress

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Assunto principal: Tecnologia Limite: Humans Idioma: En Ano de publicação: 2022 Tipo de documento: Article

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