Post-acquisition mask misalignment correction for edge illumination x-ray phase contrast imaging.

Shoukroun, D; Doherty, A; Endrizzi, M; Bate, D; Fromme, P; Olivo, A

Shoukroun, D; Doherty, A; Endrizzi, M; Bate, D; Fromme, P; Olivo, A.

Afiliação

Shoukroun D; Department of Medical Physics and Biomedical Engineering, University College London, London WC1E 6BT, United Kingdom.
Doherty A; Department of Medical Physics and Biomedical Engineering, University College London, London WC1E 6BT, United Kingdom.
Endrizzi M; Department of Medical Physics and Biomedical Engineering, University College London, London WC1E 6BT, United Kingdom.
Bate D; Nikon, X-Tek Systems, Ltd., Tring, Hertfordshire HP23 4JX, United Kingdom.
Fromme P; Department of Mechanical Engineering, University College London, London WC1E 6BT, United Kingdom.
Olivo A; Department of Medical Physics and Biomedical Engineering, University College London, London WC1E 6BT, United Kingdom.

Rev Sci Instrum ; 93(5): 053706, 2022 May 01.

Article em En | MEDLINE | ID: mdl-35649794

Assuntos

Artefatos; Iluminação; Radiografia; Raios X

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Assunto principal: Iluminação / Artefatos Tipo de estudo: Diagnostic_studies Idioma: En Ano de publicação: 2022 Tipo de documento: Article

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