Nanoscale defect evaluation framework combining real-time transmission electron microscopy and integrated machine learning-particle filter estimation.

Sasaki, K; Muramatsu, M; Hirayama, K; Endo, K; Murayama, M

Sasaki, K; Muramatsu, M; Hirayama, K; Endo, K; Murayama, M.

Afiliação

Sasaki K; Department of Science for Open and Environmental Systems, Graduate School of Keio University, 3-14-1, Hiyoshi, Kohoku-ku, Kanagawa, 233-8522, Japan.
Muramatsu M; Department of Science for Open and Environmental Systems, Graduate School of Keio University, 3-14-1, Hiyoshi, Kohoku-ku, Kanagawa, 233-8522, Japan. muramatsu@mech.keio.ac.jp.
Hirayama K; Department of Science for Open and Environmental Systems, Graduate School of Keio University, 3-14-1, Hiyoshi, Kohoku-ku, Kanagawa, 233-8522, Japan.
Endo K; Department of Science for Open and Environmental Systems, Graduate School of Keio University, 3-14-1, Hiyoshi, Kohoku-ku, Kanagawa, 233-8522, Japan.
Murayama M; Department of Materials Science and Engineering, Virginia Tech, Blacksburg, VA, 24061, USA.

Sci Rep ; 12(1): 10525, 2022 Jun 22.

Article em En | MEDLINE | ID: mdl-35732650

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2022 Tipo de documento: Article

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2022 Tipo de documento: Article