Atomic-Scale Rectification and Inelastic Electron Tunneling Spectromicroscopy.

Yao, Jiang; Wagner, Peter J; Xia, Yunpeng; Czap, Gregory; Ho, W

Yao, Jiang; Wagner, Peter J; Xia, Yunpeng; Czap, Gregory; Ho, W.

Afiliação

Yao J; Department of Physics and Astronomy, University of California, Irvine, California 92697-4575, United States.
Wagner PJ; Department of Physics and Astronomy, University of California, Irvine, California 92697-4575, United States.
Xia Y; Department of Physics and Astronomy, University of California, Irvine, California 92697-4575, United States.
Czap G; Department of Physics and Astronomy, University of California, Irvine, California 92697-4575, United States.
Ho W; Department of Physics and Astronomy, University of California, Irvine, California 92697-4575, United States.

Nano Lett ; 22(19): 7848-7852, 2022 Oct 12.

Article em En | MEDLINE | ID: mdl-36162080

Assuntos

Elétrons; Microscopia de Tunelamento; Condutividade Elétrica; Microscopia de Tunelamento/métodos; Nanotecnologia; Análise Espectral/métodos

Palavras-chave

inelastic electron tunneling; inelastic tunneling probe; molecular vibrations; rectification; scanning tunneling microscope; submolecular contrast

Texto completo

Imprimir

XML

PubMed Links

Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Assunto principal: Microscopia de Tunelamento / Elétrons Idioma: En Ano de publicação: 2022 Tipo de documento: Article

Texto completo

Imprimir

XML

PubMed Links

Buscar no Google