Exploring the influence of focused ion beam processing and scanning electron microscopy imaging on solid-state electrolytes.

Ding, Ziming; Tang, Yushu; Chakravadhanula, Venkata Sai Kiran; Ma, Qianli; Tietz, Frank; Dai, Yuting; Scherer, Torsten; Kübel, Christian

Ding, Ziming; Tang, Yushu; Chakravadhanula, Venkata Sai Kiran; Ma, Qianli; Tietz, Frank; Dai, Yuting; Scherer, Torsten; Kübel, Christian.

Afiliação

Ding Z; Institute of Nanotechnology (INT), Karlsruhe Institute of Technology (KIT), Eggenstein-Leopoldshafen 76344, Germany.
Tang Y; Institute of Materials Science, Technische Universität Darmstadt, Darmstadt 64289, Germany.
Chakravadhanula VSK; Institute of Nanotechnology (INT), Karlsruhe Institute of Technology (KIT), Eggenstein-Leopoldshafen 76344, Germany.
Ma Q; Skyroot Aerospace Pvt. Ltd., Hyderabad, Telangana, India.
Tietz F; Institute of Energy and Climate Research, Materials Synthesis and Processing (IEK-1), Forschungszentrum Jülich GmbH, Jülich 52425, Germany.
Dai Y; Institute of Energy and Climate Research, Materials Synthesis and Processing (IEK-1), Forschungszentrum Jülich GmbH, Jülich 52425, Germany.
Scherer T; Institute of Nanotechnology (INT), Karlsruhe Institute of Technology (KIT), Eggenstein-Leopoldshafen 76344, Germany.
Kübel C; Institute of Materials Science, Technische Universität Darmstadt, Darmstadt 64289, Germany.

Microscopy (Oxf) ; 72(4): 326-335, 2023 Aug 04.

Article em En | MEDLINE | ID: mdl-36408996

Palavras-chave

Au coating; beam damage; cryogenic condition; focused ion beam; scanning electron microscopy; solid-state electrolyte

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2023 Tipo de documento: Article

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2023 Tipo de documento: Article