Passive dual-probe near-field microscopy.

Sakuma, R; Nagai, Y; Nakajima, H; Lin, K-T; Kajihara, Y

Sakuma, R; Nagai, Y; Nakajima, H; Lin, K-T; Kajihara, Y.

Afiliação

Sakuma R; Department of Precision Engineering, The University of Tokyo, Bunkyo-ku, Tokyo 113-8654, Japan.
Nagai Y; Department of Precision Engineering, The University of Tokyo, Bunkyo-ku, Tokyo 113-8654, Japan.
Nakajima H; Department of Precision Engineering, The University of Tokyo, Bunkyo-ku, Tokyo 113-8654, Japan.
Lin KT; Institute of Industrial Science, The University of Tokyo, Meguro-ku, Tokyo 153-8505, Japan.
Kajihara Y; Department of Precision Engineering, The University of Tokyo, Bunkyo-ku, Tokyo 113-8654, Japan.

Rev Sci Instrum ; 93(11): 113708, 2022 Nov 01.

Article em En | MEDLINE | ID: mdl-36461468

Texto completo

Imprimir

XML

PubMed Links

Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2022 Tipo de documento: Article

Texto completo

Imprimir

XML

PubMed Links

Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2022 Tipo de documento: Article