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Interpretation of Reflection and Colorimetry Characteristics of Indium-Particle Films by Means of Ellipsometric Modeling.
Zhang, Hao-Tian; He, Rong; Peng, Lei; Yang, Yu-Ting; Sun, Xiao-Jie; Zhang, Yu-Shan; Zheng, Yu-Xiang; Liu, Bao-Jian; Zhang, Rong-Jun; Wang, Song-You; Li, Jing; Lee, Young-Pak; Chen, Liang-Yao.
Afiliação
  • Zhang HT; Department of Optical Science and Engineering, School of Information Science and Technology, Fudan University, Shanghai 200433, China.
  • He R; Department of Optical Science and Engineering, School of Information Science and Technology, Fudan University, Shanghai 200433, China.
  • Peng L; Department of Optical Science and Engineering, School of Information Science and Technology, Fudan University, Shanghai 200433, China.
  • Yang YT; Department of Optical Science and Engineering, School of Information Science and Technology, Fudan University, Shanghai 200433, China.
  • Sun XJ; Department of Optical Science and Engineering, School of Information Science and Technology, Fudan University, Shanghai 200433, China.
  • Zhang YS; Department of Optical Science and Engineering, School of Information Science and Technology, Fudan University, Shanghai 200433, China.
  • Zheng YX; Department of Optical Science and Engineering, School of Information Science and Technology, Fudan University, Shanghai 200433, China.
  • Liu BJ; High Tech Center for New Materials, Novel Devices and Cutting-Edge Manufacturing, Yiwu Research Institute, Fudan University, Yiwu 322000, China.
  • Zhang RJ; Department of Optical Science and Engineering, School of Information Science and Technology, Fudan University, Shanghai 200433, China.
  • Wang SY; Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China.
  • Li J; Department of Optical Science and Engineering, School of Information Science and Technology, Fudan University, Shanghai 200433, China.
  • Lee YP; Department of Optical Science and Engineering, School of Information Science and Technology, Fudan University, Shanghai 200433, China.
  • Chen LY; Department of Optical Science and Engineering, School of Information Science and Technology, Fudan University, Shanghai 200433, China.
Nanomaterials (Basel) ; 13(3)2023 Jan 18.
Article em En | MEDLINE | ID: mdl-36770343

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Prognostic_studies Idioma: En Ano de publicação: 2023 Tipo de documento: Article

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Prognostic_studies Idioma: En Ano de publicação: 2023 Tipo de documento: Article