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Evaluation of Microlenses, Color Filters, and Polarizing Filters in CIS for Space Applications.
Durnez, Clémentine; Virmontois, Cédric; Panuel, Pierre; Antonsanti, Aubin; Goiffon, Vincent; Estribeau, Magali; Saint-Pé, Olivier; Lalucaa, Valérian; Berdin, Erick; Larnaudie, Franck; Belloir, Jean-Marc; Codreanu, Catalin; Chavanne, Ludovic.
Afiliação
  • Durnez C; Centre National D'Etudes Spatiales (CNES), 18 Avenue Edouard Belin, 31400 Toulouse, France.
  • Virmontois C; Centre National D'Etudes Spatiales (CNES), 18 Avenue Edouard Belin, 31400 Toulouse, France.
  • Panuel P; Centre National D'Etudes Spatiales (CNES), 18 Avenue Edouard Belin, 31400 Toulouse, France.
  • Antonsanti A; Centre National D'Etudes Spatiales (CNES), 18 Avenue Edouard Belin, 31400 Toulouse, France.
  • Goiffon V; Department of Electronics, Optronics and Signal Processing (DEOS), Institut Supérieur de l'Aéronautique et de l'Espace (ISAE-SUPAERO), 10 Avenue Edouard Belin, 31400 Toulouse, France.
  • Estribeau M; Department of Electronics, Optronics and Signal Processing (DEOS), Institut Supérieur de l'Aéronautique et de l'Espace (ISAE-SUPAERO), 10 Avenue Edouard Belin, 31400 Toulouse, France.
  • Saint-Pé O; Department of Electronics, Optronics and Signal Processing (DEOS), Institut Supérieur de l'Aéronautique et de l'Espace (ISAE-SUPAERO), 10 Avenue Edouard Belin, 31400 Toulouse, France.
  • Lalucaa V; Airbus Defence and Space, 31 Rue des Cosmonautes, 31400 Toulouse, France.
  • Berdin E; Centre National D'Etudes Spatiales (CNES), 18 Avenue Edouard Belin, 31400 Toulouse, France.
  • Larnaudie F; Airbus Defence and Space, 31 Rue des Cosmonautes, 31400 Toulouse, France.
  • Belloir JM; Airbus Defence and Space, 31 Rue des Cosmonautes, 31400 Toulouse, France.
  • Codreanu C; Centre National D'Etudes Spatiales (CNES), 18 Avenue Edouard Belin, 31400 Toulouse, France.
  • Chavanne L; Centre National D'Etudes Spatiales (CNES), 18 Avenue Edouard Belin, 31400 Toulouse, France.
Sensors (Basel) ; 23(13)2023 Jun 25.
Article em En | MEDLINE | ID: mdl-37447732
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Assunto principal: Semicondutores / Diagnóstico por Imagem Tipo de estudo: Diagnostic_studies Idioma: En Ano de publicação: 2023 Tipo de documento: Article
Texto completo
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XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Assunto principal: Semicondutores / Diagnóstico por Imagem Tipo de estudo: Diagnostic_studies Idioma: En Ano de publicação: 2023 Tipo de documento: Article