Studies of Benzotriazole on and into the Copper Electrodeposited Layer by Cyclic Voltammetry, Time-of-Flight Secondary-Ion Mass Spectrometry, Atomic Force Microscopy, and Surface Enhanced Raman Spectroscopy.

Mroczka, Robert; Slodkowska, Agnieszka

Mroczka, Robert; Slodkowska, Agnieszka.

Afiliação

Mroczka R; Laboratory of X-ray Optics, Department of Chemistry, Institute of Biological Sciences, Faculty of Medicine, The John Paul II Catholic University of Lublin, Konstantynów 1J, 20-708 Lublin, Poland.
Slodkowska A; Laboratory of X-ray Optics, Department of Chemistry, Institute of Biological Sciences, Faculty of Medicine, The John Paul II Catholic University of Lublin, Konstantynów 1J, 20-708 Lublin, Poland.

Molecules ; 28(15)2023 Aug 06.

Article em En | MEDLINE | ID: mdl-37570882

Palavras-chave

AFM; SERS; TOF-SIMS; benzotriazole; copper electrodeposition; cyclic voltammetry

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2023 Tipo de documento: Article

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2023 Tipo de documento: Article