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Deep Learning Approach for High-accuracy Electron Counting of Direct Electron Detectors at Increased Electron Dose.
Wei, Jingrui; Moore, Kalani; Bammes, Benjamin; Levin, Barnaby D A; Morgan, Dane; Voyles, Paul M.
Afiliação
  • Wei J; Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI, United States of America.
  • Moore K; Direct Electron L.P., San Diego, CA, United States of America.
  • Bammes B; Direct Electron L.P., San Diego, CA, United States of America.
  • Levin BDA; Direct Electron L.P., San Diego, CA, United States of America.
  • Voyles PM; Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI, United States of America.
Microsc Microanal ; 29(Supplement_1): 702-704, 2023 Jul 22.
Article em En | MEDLINE | ID: mdl-37613170
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2023 Tipo de documento: Article
Texto completo
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XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2023 Tipo de documento: Article