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Interfacial Microstructure and Thermal Property of Diamond/Si and 3C-SiC/Si film.
Zhang, Chunyan; Zhang, Yuying; Ni, Chaoying.
Afiliação
  • Zhang C; Department of Materials Science and Engineering, University of Delaware, Newark, DE, United States.
  • Zhang Y; Department of Materials Science and Engineering, University of Delaware, Newark, DE, United States.
  • Ni C; Department of Materials Science and Engineering, University of Delaware, Newark, DE, United States.
Microsc Microanal ; 29(Supplement_1): 794-795, 2023 Jul 22.
Article em En | MEDLINE | ID: mdl-37613417

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2023 Tipo de documento: Article

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2023 Tipo de documento: Article