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U-Net Implementation for High Throughput Grain Boundary Detection in Bright Field TEM Micrographs: Toward In Situ Grain Growth Studies.
Patrick, Matthew J; Eckstein, James K; Lopez, Javier; Ma, Alan J; Toderas, Silvia; Levine, Stacey; Barmak, Katayun.
Afiliação
  • Patrick MJ; Department of Applied Physics and Applied Mathematics, Columbia University, New York, NY, USA.
  • Eckstein JK; Department of Physics, University of Illinois -- Urbana-Champaign, Champaign, IL, USA.
  • Lopez J; Department of Mechanical Engineering, Columbia University, New York, NY, USA.
  • Ma AJ; Department of Mathematics, Columbia University, New York, NY, USA.
  • Toderas S; Department of Applied Physics and Applied Mathematics, Columbia University, New York, NY, USA.
  • Levine S; Department of Mathematics and Computer Science, Duquesne University, Pittsburgh, PA, USA.
  • Barmak K; Department of Applied Physics and Applied Mathematics, Columbia University, New York, NY, USA.
Microsc Microanal ; 29(Supplement_1): 1581-1582, 2023 Jul 22.
Article em En | MEDLINE | ID: mdl-37613857
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Diagnostic_studies Idioma: En Ano de publicação: 2023 Tipo de documento: Article
Texto completo
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Diagnostic_studies Idioma: En Ano de publicação: 2023 Tipo de documento: Article