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A pixelated liquid perovskite array for high-sensitivity and high-resolution X-ray imaging scintillation screens.
Hu, Mingzhu; Wang, Yumeng; Hu, Shengpeng; Wang, Zongpeng; Du, Bi; Peng, Yanjun; Yang, Jiawei; Shi, Yunjie; Chen, Dongdong; Chen, Xi; Zhuang, Ziwen; Wang, Zhixun; Chen, Xi; Yang, Jiecheng; Ge, Yongshuai; Wang, Eyu; Wen, Quan; Xiao, Shuang; Ma, Ming; Li, Weimin; Zhang, Jie; Ning, De; Wei, Lei; Yang, Chunlei; Chen, Ming.
Afiliação
  • Hu M; Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen 518055, People's Republic of China. de.ning@siat.ac.cn.
  • Wang Y; Department of Nano Science and Technology Institute, University of Science and Technology of China, Suzhou 215123, People's Republic of China.
  • Hu S; School of Microelectronics, University of Science and Technology of China, Hefei 230026, People's Republic of China.
  • Wang Z; Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen 518055, People's Republic of China. de.ning@siat.ac.cn.
  • Du B; Department of Nano Science and Technology Institute, University of Science and Technology of China, Suzhou 215123, People's Republic of China.
  • Peng Y; Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen 518055, People's Republic of China. de.ning@siat.ac.cn.
  • Yang J; Department of Nano Science and Technology Institute, University of Science and Technology of China, Suzhou 215123, People's Republic of China.
  • Shi Y; Shenzhen Angell Technology Co. Ltd, Shenzhen 518057, People's Republic of China.
  • Chen D; Shenzhen Angell Technology Co. Ltd, Shenzhen 518057, People's Republic of China.
  • Chen X; Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen 518055, People's Republic of China. de.ning@siat.ac.cn.
  • Zhuang Z; Department of Nano Science and Technology Institute, University of Science and Technology of China, Suzhou 215123, People's Republic of China.
  • Wang Z; Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen 518055, People's Republic of China. de.ning@siat.ac.cn.
  • Chen X; Department of Nano Science and Technology Institute, University of Science and Technology of China, Suzhou 215123, People's Republic of China.
  • Yang J; Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen 518055, People's Republic of China. de.ning@siat.ac.cn.
  • Ge Y; Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen 518055, People's Republic of China. de.ning@siat.ac.cn.
  • Wang E; Department of Nano Science and Technology Institute, University of Science and Technology of China, Suzhou 215123, People's Republic of China.
  • Wen Q; Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen 518055, People's Republic of China. de.ning@siat.ac.cn.
  • Xiao S; Department of Nano Science and Technology Institute, University of Science and Technology of China, Suzhou 215123, People's Republic of China.
  • Ma M; Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen 518055, People's Republic of China. de.ning@siat.ac.cn.
  • Li W; School of Electrical and Electronic Engineering, Nanyang Technological University, 50 Nanyang Avenue, 639798, Singapore. wei.lei@ntu.edu.sg.
  • Zhang J; Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen 518055, People's Republic of China. de.ning@siat.ac.cn.
  • Ning; University of Chinese Academy of Sciences, Beijing 100049, People's Republic of China.
  • Wei L; Paul C Lauterbur Research Center for Biomedical Imaging, Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen, Guangdong 518055, China.
  • Yang C; Research Center for Medical Artificial Intelligence, Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen, Guangdong 518055, China.
  • Chen M; Paul C Lauterbur Research Center for Biomedical Imaging, Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen, Guangdong 518055, China.
Nanoscale ; 15(38): 15635-15642, 2023 Oct 05.
Article em En | MEDLINE | ID: mdl-37721742

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Diagnostic_studies Idioma: En Ano de publicação: 2023 Tipo de documento: Article

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Diagnostic_studies Idioma: En Ano de publicação: 2023 Tipo de documento: Article