Experimental Characterization of Defect-Induced Phonon Lifetime Shortening.
Phys Rev Lett
; 132(5): 056202, 2024 Feb 02.
Article
em En
| MEDLINE
| ID: mdl-38364135
ABSTRACT
We present the first direct experimental measurement of defect-induced lifetime shortening of acoustic surface phonons. Defects are found to contribute a temperature-independent component to the linewidths of Rayleigh wave phonons on a Ni(111) surface. We also characterized the increase in phonon scattering with both surface defect density and phonon wave vector. A quantitative estimate of the scattering rate between phonon modes and surface line defects is extracted from the experimental data for the first time.
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Coleções:
01-internacional
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MEDLINE
Idioma:
En
Ano de publicação:
2024
Tipo de documento:
Article