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Application of Weak-Beam Dark-Field STEM for Dislocation Loop Analysis†.
Lin, Yan-Ru; Li, Yao; Zinkle, Steven J; Arregui-Mena, Jose' D; Burke, M Grace.
Afiliação
  • Lin YR; Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.
  • Li Y; Department of Nuclear Engineering, University of Tennessee, Knoxville, TN 37996, USA.
  • Zinkle SJ; Materials Physics and Applications Division, Center for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, NM 87545, USA.
  • Arregui-Mena JD; Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.
  • Burke MG; Department of Nuclear Engineering, University of Tennessee, Knoxville, TN 37996, USA.
Microsc Microanal ; 30(4): 681-691, 2024 Aug 21.
Article em En | MEDLINE | ID: mdl-39008342
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2024 Tipo de documento: Article
Texto completo
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XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2024 Tipo de documento: Article