Applications of focused ion beam systems in gunshot residue investigation.
J Forensic Sci
; 44(1): 105-9, 1999 Jan.
Article
em En
| MEDLINE
| ID: mdl-9987878
ABSTRACT
Scanning ion microscopy technology has opened a new door to forensic scientists, allowing the GSR investigator to see inside a particle's core. Using a focused ion beam, particles can be cross-sectioned, revealing interior morphology and character that can be utilized for identification of the ammunition manufacturer.
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Coleções:
01-internacional
Base de dados:
MEDLINE
Assunto principal:
Ferimentos por Arma de Fogo
/
Armas de Fogo
/
Espectrometria de Massa de Íon Secundário
Limite:
Humans
Idioma:
En
Ano de publicação:
1999
Tipo de documento:
Article