A New Analytic Formula for Minority Carrier Decay Length Extraction from Scanning Photocurrent Profiles in Ohmic-Contact Nanowire Devices.

Chu, Cheng-Hao; Mao, Ming-Hua; Yang, Che-Wei; Lin, Hao-Hsiung

Chu, Cheng-Hao; Mao, Ming-Hua; Yang, Che-Wei; Lin, Hao-Hsiung.

Afiliação

Chu CH; Graduate Institute of Electronics Engineering, National Taiwan University, No. 1, Roosevelt Rd. Sec. 4, Taipei, 10617, Taiwan.
Mao MH; Graduate Institute of Electronics Engineering, National Taiwan University, No. 1, Roosevelt Rd. Sec. 4, Taipei, 10617, Taiwan. mhmao@ntu.edu.tw.
Yang CW; Department of Electrical Engineering, National Taiwan University, No. 1, Roosevelt Rd. Sec. 4, Taipei, 10617, Taiwan. mhmao@ntu.edu.tw.
Lin HH; Graduate Institute of Photonics and Optoelectronics, National Taiwan University, No. 1, Roosevelt Rd. Sec. 4, Taipei, 10617, Taiwan. mhmao@ntu.edu.tw.

Sci Rep ; 9(1): 9426, 2019 Jul 01.

Article em En | MEDLINE | ID: mdl-31263209

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Sci Rep Ano de publicação: 2019 Tipo de documento: Article País de afiliação: Taiwan País de publicação: Reino Unido

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