Orientation contrast of secondary electron images from electropolished metals.

Orientation contrast obtained by an in-lens secondary electron detector in a scanning electron microscope from electropolished/etched metals is reported. The imaging conditions for obtaining such orientation contrast are defined. The mechanism responsible for the formation of the orientation contrast is explained, and an application example of this new imaging method is given.

Electron microscopy of materials at the University of Birmingham.

The School of Metallurgy and Materials has traditionally put transmission electron microscopy (TEM) in the forefront of its research interests and, through support from SERC and from the university, has always had the facility to carry out state of the art electron microscopy of materials. In this brief review some of the topics where TEM has played a central role in recent work in Birmingham will be described so that it will be seen just how central to the work in Birmingham TEM has been.