Electrochemically Stable Ligands of ZnO Electron-Transporting Layers for Quantum-Dot Light-Emitting Diodes.

Thin films of ZnO nanocrystals are actively pursued as electron-transporting layers (ETLs) in quantum-dot light-emitting diodes (QLEDs). However, the developments of ZnO-based ETLs are highly engineering oriented and the design of ZnO-based ETLs remains empirical. Here, we identified a previously overlooked efficiency-loss channel associated with the ZnO-based ETLs: i.e., interfacial exciton quenching induced by surface-bound ethanol. Accordingly, we developed a general surface-treatment procedure to replace the redox-active surface-bound ethanol with electrochemically inert alkali carboxylates. Characterization results show that the surface treatment procedure does not change other key properties of the ETLs, such as the conductance and work function. Our single-variable experimental design unambiguously demonstrates that improving the electrochemical stabilities of the ZnO ETLs leads to QLEDs with a higher efficiency and longer operational lifetime. Our work provides a crucial guideline to design ZnO-based ETLs for optoelectronic devices.

Synthesis of Cu-Modified Nickel Oxide Nanocrystals and Their Applications as Hole-Injection layers for Quantum-Dot Light-Emitting Diodes.

Solution-processed NiOx thin films have been applied as hole-injection layers (HILs) in quantum-dot light-emitting diodes (QLEDs). The commonly used NiOx HILs are prepared by the precursor-based route, which requires high annealing temperatures of over 275 °C to in situ convert the precursors into oxide films. Such high processing temperatures of NiOx HILs hinder their applications in flexible devices. Herein, we report a low-temperature approach based on Cu-modified NiOx (NiOx -Cu) nanocrystals to prepare HILs. A simple post-synthetic surface-modification step, which anchors the copper agents onto the surfaces of oxide nanocrystals, is developed to improve the electrical conductivity of the low-temperature-processed (135 °C) oxide-nanocrystal thin films. In consequence, QLEDs based on the NiOx -Cu HILs exhibit an external quantum efficiency of 17.5 % and a T95 operational lifetime of ∼2,800 h at an initial brightness of 1,000 cd m-2 , meeting the commercialization requirements for display applications. The results shed light on the potential of using NiOx -Cu HILs for realizing high-performance flexible QLEDs.

Comparative Study of Red/Green/Blue Quantum-Dot Light-Emitting Diodes by Time-Resolved Transient Electroluminescence.

To understand the electronic processes in quantum-dot light-emitting diodes (QLEDs), a comparative study was performed by time-resolved transient electroluminescence (TREL). We fabricated red, green, and blue (R-, G-, and B-) QLEDs with poly(9,9-dioctylfluorene-co-N-(4-sec-butylphenyl)diphenylamine) as the hole-transporting layer with conventional structures. The external quantum efficiency (EQE) and current efficiency were 19.2% and 22.7 cd A-1 for R-QLEDs, 21.1% and 93.3 cd A-1 for G-QLEDs, and 10.6% and 10.4 cd A-1 for B-QLEDs, respectively. The TREL results for B-QLEDs were remarkably different from those for R- and G-QLEDs because of the insufficient electron injection crossing the type II heterojunction between the emission layer and the electron-transporting layer. We further applied poly(N-vinylcarbazole) as the hole-transporting layer and obtained much better performance for B-QLEDs, with EQE and current efficiency of 15.9% and 15.4 cd A-1, respectively. Concomitant with the increase in EQE are an increase in the turn-on voltage from 2.3 to 3.7 V and a transient electroluminescence spike after voltage turn-off.