Effect of Isothermal Conditions on the Charge Trapping/Detrapping Parameters in e-Beam Irradiated Thermally Aged XLPE Insulation in SEM.

The effect of isothermal conditions on the trapping/detrapping process of charges in e-beam irradiated thermally aged XLPE insulation in scanning electron microscopy (SEM) has been investigated. Different isothermal conditions ranging from room temperature to 120 °C are applied on both unaged and aged XLPE samples (2 mm thick) by a suitable arrangement associated with SEM. For each applied test temperature, leakage, and influence currents have been measured simultaneously during and after e-beam irradiation. Experimental results show a big difference between the fresh and aged material regarding trapping and detrapping behavior. It has been pointed out that in the unaged material deep traps govern the process, whereas the shallow traps take part in the aged one. Almost all obtained results reveal that the trapped charge decreases and then increases as the temperature increases for the unaged sample. A deflection temperature corresponding to a minimum is observed at 50 °C. However, for the aged material, the maximum trapped charge decreases continuously with increasing temperature, and the material seems to trap fewer charges under e-beam irradiation at high temperature. Furthermore, thermal aging leads to the occurrence of detrapping process at high temperatures even under e-beam irradiation, which explains the decrease with time evolution of trapped charge during this period. The recorded leakage current increases with increasing temperature for both cases with pronounced values for aged material. The effect of temperature and thermal aging on electrostatic influence factor (K) and total secondary electron emission yield (σ) were also studied.

Study of temperature effects on the electrical behavior of polypropylene-clay nanocomposites submitted to electron beam irradiation in a SEM.

Charge transport and electron emission properties in polypropylene and its nanocomposites filled with nanoclay particles submitted to an electron irradiation, in a Scanning Electron Microscope (SEM), are investigated using induced displacement and leakage currents. The measurements have been performed at various temperatures ranging from 20°C to 75°C at a primary beam energy of 20keV and a primary beam current of 1nA with the aim to highlight the effect of temperature and nanoclay content on these properties. The results show, at a given temperature, that the incorporation of clay in polypropylene (PP) matrix paradoxically leads to a concomitant increase in the electrical conductivity and the charge accumulated. In contrast, if the clay content is fixed, there is an increase in conductivity and a reduction of the charge accumulated when the temperature increases. The mobility of charge carriers and the corresponding activation energy are deduced from the measured leakage current during discharging step. The mobility was found to be an order of magnitude higher for the nanocomposites. The study of the influence of the temperature and nanoclay concentration on electron emission yield is also addressed.

Charge implantation measurement on electron-irradiated insulating materials by means of an SEM technique.

The goal of this article is first to review the charging effects occurring when an insulating material is subjected to electron irradiation in a scanning electron microscope (SEM) and next their consequences from both scanning electron microscopy and electron probe microanalysis (EPMA) points of view. When bare insulators are observed, the so-called pseudo mirror effect leads to an anomalous contrast and also to an erroneous surface potential, V(S), measurement when a Duane-Hunt limit (DHL) method is used. An alternative possibility is to use an electron toroidal spectrometer (ETS), specially adapted to a SEM, which directly gives the V(S) value. In the case of a bulk specimen coated with a grounded layer, although the layer prevents external effects of the trapped charge, the electric field beneath the coating is reinforced and leads to loss of ionizations that reduces the number of generated X-ray photons. To take into account both effects mentioned above, whether the studied insulator is coated or not, a method is proposed to deduce the trapped charge inside the insulator and the corresponding internal or external electric field.