Resource Document on Best Practices in Synchronous Videoconferencing-Based Telemental Health.

Background: This document represents an updated collaboration between the American Psychiatric Association (APA) and the American Telemedicine Association (ATA) to create a consolidated update of the previous APA and ATA official documents and resources in telemental health, to provide a single guide on clinical best practices for providing mental health services through synchronous videoconference. Methods: A joint writing committee drawn from the APA Committee on Telepsychiatry and the ATA TMH Special Interest Group (TMH SIG). was convened to draft and finalize the guidelines. This document draws directly from the 2018 APA/ATA guide and the ATA s previous guidelines, selecting from key statements/guidelines, consolidating them across documents, and then updating them where indicated. Guideline approval was provided following internal review by the APA, the ATA, the Board of Directors of the ATA, and the Joint Reference Committee of the APA. Results: The guidelines contain requirements, recommendations, and actions that are identified by text containing the keywords "shall," "should," or "may." Conclusions: Compliance with these recommendations will not guarantee accurate diagnoses or successful outcomes. The purpose of this guide is to assist providers in providing effective and safe medical care founded on expert consensus, research evidence, available resources, and patient needs.

X-ray beam quality after a mirror reflection: Experimental and simulated results for a toroidal mirror in a 4 th generation storage-ring beamline.

Background: The surface errors found in X-ray mirrors constitute a limiting factor for preserving beam quality. This is particularly important when the X-ray beam has low emittance and a significant coherence fraction, like in newly upgraded synchrotron storage rings. Methods: We studied the fringes observed in the image of an undulator-produced X-ray beam reflected by a high-quality toroidal mirror. The measurements and simulations were performed using different conditions: a photon beam either monochromatic or with large bandwidth, reflected by a mirror with variable curvature. Results: The experimental data are compared with up-to-date simulation including partial coherence. Conclusions: The observed fringes in the unfocused beam correlate with low spatial frequency structures in mirror profiles, irrespective of beam coherence. Both classical ray tracing and partially coherent simulations through coherent mode decomposition are confirmed as accurate methods for such simulations.

In this study, researchers focused on the surface errors found in X-ray mirrors and their impact on beam quality. These errors can be problematic, especially when dealing with X-ray beams coming from low emittance (a measure of beam size and divergence) electron beam sources and a significant coherence fraction (indicating the level of wavefront coherence). The researchers specifically investigated the fringes observed in the image of an X-ray beam produced by an undulator and reflected by a high-quality toroidal mirror. They conducted measurements and simulations under different conditions, such as using a monochromatic photon beam or one with a wide range of wavelengths, and varying the curvature of the mirror.

X-ray mirrors with sub-nanometre figure errors obtained by differential deposition of thin WSi2 films.

Differential deposition by DC magnetron sputtering was applied to correct for figure errors of X-ray mirrors to be deployed on low-emittance synchrotron beamlines. During the deposition process, the mirrors were moved in front of a beam-defining aperture and the required velocity profile was calculated using a deconvolution algorithm. The surface figure was characterized using conventional off-line visible-light metrology instrumentation (long trace profiler and Fizeau interferometer) before and after the deposition. WSi2 was revealed to be a promising candidate material since it conserves the initial substrate surface roughness and limits the film stress to acceptable levels. On a 300 mm-long flat Si mirror the average height errors were reduced by a factor of 20 down to 0.2 nm root mean square. This result shows the suitability of WSi2 for differential deposition. Potential promising applications include the upgrade of affordable, average-quality substrates to the standards of modern synchrotron beamlines.

Tilting refractive x-ray lenses for fine-tuning of their focal length.

In this work, we measure and model tilted x-ray refractive lenses to investigate their effects on an x-ray beam. The modelling is benchmarked against at-wavelength metrology obtained with x-ray speckle vector tracking experiments (XSVT) at the BM05 beamline at the ESRF-EBS light source, showing very good agreement. This validation permits us to explore possible applications of tilted x-ray lenses in optical design. We conclude that while tilting 2D lenses does not seem interesting from the point of view of aberration-free focusing, tilting 1D lenses around their focusing direction can be used for smoothly fine-tuning their focal length. We demonstrate experimentally this continuous change in the apparent lens radius of curvature R: a reduction up to a factor of two and beyond is achieved and possible applications in beamline optical design are proposed.

Polished diamond X-ray lenses.

High-quality bi-concave 2D focusing diamond X-ray lenses of apex-radius R = 100 µm produced via laser-ablation and improved via mechanical polishing are presented here. Both for polished and unpolished individual lenses and for stacks of ten lenses, the remaining figure errors determined using X-ray speckle tracking are shown and these results are compared with those of commercial R = 50 µm beryllium lenses that have similar focusing strength and physical aperture. For two stacks of ten diamond lenses (polished and unpolished) and a stack of eleven beryllium lenses, this paper presents measured 2D beam profiles out of focus and wire scans to obtain the beam size in the focal plane. These results are complemented with small-angle X-ray scattering (SAXS) measurements of a polished and an unpolished diamond lens. Again, this is compared with the SAXS of a beryllium lens. The polished X-ray lenses show similar figure errors to commercially available beryllium lenses. While the beam size in the focal plane is comparable to that of the beryllium lenses, the SAXS signal of the polished diamond lenses is considerably lower.

Measurement techniques to improve the accuracy of x-ray mirror metrology using stitching Shack-Hartmann wavefront sensors.

We describe the development of specific measurement protocols to improve the accuracy of surface metrology of x-ray mirrors using a dedicated commercial instrument based on wavefront sensing techniques. This instrument, SHARPeR, uses measurements from a Shack-Hartmann wavefront sensor combined with a sub-aperture stitching method to provide two-dimensional maps of the surface slope errors and can measure curved mirrors above 1 m radii. In this paper, we describe the results of measurement methods developed on a SHARPeR system installed at the European Synchrotron (ESRF) to reduce the contribution of systematic errors to measurements of strongly curved spherical and aspherical x-ray mirrors with intrinsic slope errors of the order of 100-200 nrad rms. We demonstrate how this commercial integrated instrument can provide measurements of these mirrors with comparable accuracy to those measured with a long trace profiler.

X-ray optics and beam characterization using random modulation: theory.

X-ray near-field speckle-based phase-sensing approaches provide efficient means of characterizing optical elements. Presented here is a theoretical review of several of these speckle methods within the framework of optical characterization, and a generalization of the concept is provided. As is also demonstrated experimentally in a parallel paper [Berujon, Cojocaru, Piault, Celestre, Roth, Barrett & Ziegler (2020), J. Synchrotron Rad. 27, (this issue)], the methods theoretically developed here can be applied to different beams and optics and within a variety of situations where at-wavelength metrology is desired. By understanding the differences between the various processing methods, it is possible to find and implement the most suitable approach for each metrology scenario.

X-ray optics and beam characterization using random modulation: experiments.

A parallel paper [Berujon, Cojocaru, Piault, Celestre, Roth, Barrett & Ziegler (2020), J. Synchrotron Rad. 27, 284-292] reviewed theoretically some of the available processing schemes for X-ray wavefront sensing based on random modulation. Shown here are experimental applications of the technique for characterizing both refractive and reflective optical components. These fast and accurate X-ray at-wavelength metrology methods can assist the manufacture of X-ray optics that transport X-ray beams with a minimum amount of wavefront distortion. It is also recalled how such methods can facilitate online optimization of active optics.

Modelling phase imperfections in compound refractive lenses.

A framework based on physical optics for simulating the effect of imperfect compound refractive lenses (CRLs) upon an X-ray beam is described, taking into account measured phase errors obtained from at-wavelength metrology. A CRL stack is modelled, with increasing complexity, as a single thin phase element, then as a more realistic compound element including absorption and thickness effects, and finally adding realistic optical imperfections to the CRL. Coherent and partially coherent simulations using Synchrotron Radiation Workshop (SRW) are used to evaluate the different models, the effects of the phase errors and to check the validity of the design equations and suitability of the figures of merit.

X-ray mirror figure correction by differential deposition and off-line metrology.

The surface figure error of a hard X-ray mirror was improved by combining differential deposition and off-line metrology tools. Thin Cr layers were deposited on flat substrates by DC magnetron sputtering. The substrates were moved in front of a beam-defining aperture. The required velocity profile was calculated using a deconvolution algorithm. The Cr thickness profiles were measured directly using hard X-ray reflectivity data. The surface figure was characterized using conventional visible-light metrology instrumentation (long trace profiler) before and after the deposition. The method converges quickly, and after two iterations the mirror surface figure had improved by a factor of 7. The surface roughness evolves with increasing Cr thickness and deteriorates the quality of subsequent multilayer coatings. The mirror curvature can change upon coating, which complicates the interpretation of the surface metrology data. In this context, the role of layer stress is discussed. Potential improvements of the process are also proposed.

The Nanodiffraction beamline ID01/ESRF: a microscope for imaging strain and structure.

The ID01 beamline has been built to combine Bragg diffraction with imaging techniques to produce a strain and mosaicity microscope for materials in their native or operando state. A scanning probe with nano-focused beams, objective-lens-based full-field microscopy and coherent diffraction imaging provide a suite of tools which deliver micrometre to few nanometre spatial resolution combined with 10-5 strain and 10-3 tilt sensitivity. A detailed description of the beamline from source to sample is provided and serves as a reference for the user community. The anticipated impact of the impending upgrade to the ESRF - Extremely Brilliant Source is also discussed.

ID16B: a hard X-ray nanoprobe beamline at the ESRF for nano-analysis.

Within the framework of the ESRF Phase I Upgrade Programme, a new state-of-the-art synchrotron beamline ID16B has been recently developed for hard X-ray nano-analysis. The construction of ID16B was driven by research areas with major scientific and societal impact such as nanotechnology, earth and environmental sciences, and bio-medical research. Based on a canted undulator source, this long beamline provides hard X-ray nanobeams optimized mainly for spectroscopic applications, including the combination of X-ray fluorescence, X-ray diffraction, X-ray excited optical luminescence, X-ray absorption spectroscopy and 2D/3D X-ray imaging techniques. Its end-station re-uses part of the apparatus of the earlier ID22 beamline, while improving and enlarging the spectroscopic capabilities: for example, the experimental arrangement offers improved lateral spatial resolution (∼50 nm), a larger and more flexible capability for in situ experiments, and monochromatic nanobeams tunable over a wider energy range which now includes the hard X-ray regime (5-70 keV). This paper describes the characteristics of this new facility, short-term technical developments and the first scientific results.

New challenges in beamline instrumentation for the ESRF Upgrade Programme Phase II.

Although beamline instrumentation is by nature driven by science, some recent examples serve as reminders that new technologies also enable new science. Indeed, exploiting the full scientific potential of forthcoming new storage rings with unprecedented source characteristics will, in many cases, require the development and implementation of novel instrumentation. In comparison with present synchrotron radiation facilities, the majority of beamlines should reap immediate performance benefits from the improved source emittance, principally through increased flux and/or horizontal beam size reduction at the sample. Instrumentation will have to develop along similar quantitative and qualitative trends. More speculative and more challenging is anticipating instrumentation that will be required by the new science made possible thanks to the unique coherence properties of diffraction-limited storage rings (DLSRs). ESRF has recently carried out a detailed feasibility study for a new ultra-low-emittance 6 GeV hybrid multibend storage ring, identified as ESRF Upgrade Programme Phase II. Although its performance is not expected to be equivalent to a DLSR source, the successful implementation of the ESRF Phase II project has to address scientific instrumentation issues that are also common to DLSRs. This article aims at providing a comprehensive review of some of the challenges encountered by the ESRF, in the context of the preparation of Phase II of its upgrade programme.

Anisotropic elasticity of silicon and its application to the modelling of X-ray optics.

The crystal lattice of single-crystal silicon gives rise to anisotropic elasticity. The stiffness and compliance coefficient matrix depend on crystal orientation and, consequently, Young's modulus, the shear modulus and Poisson's ratio as well. Computer codes (in Matlab and Python) have been developed to calculate these anisotropic elasticity parameters for a silicon crystal in any orientation. These codes facilitate the evaluation of these anisotropy effects in silicon for applications such as microelectronics, microelectromechanical systems and X-ray optics. For mechanically bent X-ray optics, it is shown that the silicon crystal orientation is an important factor which may significantly influence the optics design and manufacturing phase. Choosing the appropriate crystal orientation can both lead to improved performance whilst lowering mechanical bending stresses. The thermal deformation of the crystal depends on Poisson's ratio. For an isotropic constant Poisson's ratio, ν, the thermal deformation (RMS slope) is proportional to (1 + ν). For a cubic anisotropic material, the thermal deformation of the X-ray optics can be approximately simulated by using the average of ν12 and ν13 as an effective isotropic Poisson's ratio, where the direction 1 is normal to the optic surface, and the directions 2 and 3 are two normal orthogonal directions parallel to the optical surface. This average is independent of the direction in the optical surface (the crystal plane) for Si(100), Si(110) and Si(111). Using the effective isotropic Poisson's ratio for these orientations leads to an error in thermal deformation smaller than 5.5%.