Atomization of As and Se volatile species in a dielectric barrier discharge atomizer after hydride generation: Fate of analyte studied by selected ion flow tube mass spectrometry.

Atomization of hydrides and their methylated analogues in a dielectric barrier discharge (DBD) plasma atomizer was investigated. Selected ion flow tube mass spectrometry (SIFT-MS) was chosen as a detector being capable of selective detection of non-atomized original volatile species allowing thus direct quantification of atomization efficiency. Selenium hydride (SeH2) and three volatile arsenic species, namely arsenic hydride (AsH3), monomethylarsane (CH3AsH2) and dimethylarsane ((CH3)2AsH), were selected as model analytes. The mechanistic study performed contributes to understanding of the atomization processes in atomic absorption spectrometry (AAS). The presented results are compatible with a complete atomization of arsenic hydride as well as its methylated analogues and with atomization efficiency of SeH2 below 80%. Using AsH3 as a model analyte and a combination of AAS and SIFT-MS detectors has revealed that the hydride is not atomized, but decomposed in the DBD atomizer in absence of hydrogen fraction in the carrier gas. Apart from investigation of analyte atomization, the SIFT-MS detector is capable of quantitative determination of water vapor content being either transported to, or produced in the atomizer. This information is crucial especially in the case of the low-power/temperature DBD atomizer since its performance is sensitive to the amount of water vapor introduced into the plasma.

Behavior of selenium hydride in heated quartz tube and dielectric barrier discharge atomizers.

Atomization of SeH2 in an externally heated multiple microflame quartz tube atomizer (MMQTA) as well as planar dielectric barrier discharge (DBD) atomizer was investigated using a variety of probes. Deposits of Se on inner surfaces of the atomizers were quantified and their distribution visualized by autoradiography with 75Se radiotracer. The gas phase fraction of Se transported beyond the confines of the atomizers was also determined. In the MMQTA, a 15% mass fraction of Se was deposited in a narrow zone at both colder ends of the optical arm (100-400 °C). By contrast, a 25-40% mass fraction of Se was deposited homogeneously along the entire length of the optical arm of the DBD, depending on detection technique employed. The fraction of Se transported outside the MMQTA approached 90%, whereas it was 50-70% in the DBD. The presence of H2 was essential for atomization of selenium hydride in both atomizers. The gaseous effluent arising from the hydride generator as well as the atomizers was investigated by direct analysis in real time (DART) coupled to an Orbitrap-mass spectrometer, enabling identification of major gas phase species of Se.

Determination of silicon and aluminum in silicon carbide nanocrystals by high-resolution continuum source graphite furnace atomic absorption spectrometry.

The determination of Al contaminant and the main component Si in silicon carbide (SiC) nanocrystals with the size-distribution of 1-8nm dispersed in an aqueous solution was developed using high-resolution continuum source graphite furnace atomic absorption spectrometry (HR-CS-GFAAS). The vaporization/atomization processes were investigated in a transversally heated graphite atomizer by evaporating solution samples of Al and Si preserved in various media (HCl, HNO3). For Si, the best results were obtained by applying a mixture of 5µg Pd plus 5µg Mg, whereas for Al, 10µg Mg (each as nitrate solution) was dispensed with the samples, but the results obtained without modifier were found to be better. This way a maximum pyrolysis temperature of 1200°C for Si and 1300°C for Al could be used, and the optimum (compromise) atomization temperature was 2400°C for both analytes. The Si and Al contents of different sized SiC nanocrystals, dispersed in aqueous solutions, were determined against aqueous (external) calibration standards. The correlation coefficients (R values) of the calibrations were found to be 0.9963 for Si and 0.9991 for Al. The upper limit of the linear calibration range was 2mg/l Si and 0.25mg/l Al. The limit of detection was 3µg/l for Si and 0.5µg/l for Al. The characteristic mass (m0) was calculated to be 389pg Si and 6.4pg Al. The Si and Al content in the solution samples were found to be in the range of 1.0-1.7mg/l and 0.1-0.25mg/l, respectively.