RESUMEN
Millicharged particles appear in several extensions of the standard model, but have not yet been detected. These hypothetical particles could be produced by an intense proton beam striking a fixed target. We use data collected in 2020 by the SENSEI experiment in the MINOS cavern at the Fermi National Accelerator Laboratory to search for ultrarelativistic millicharged particles produced in collisions of protons in the NuMI beam with a fixed graphite target. The absence of any ionization events with 3 to 6 electrons in the SENSEI data allow us to place world-leading constraints on millicharged particles for masses between 30 to 380 MeV. This work also demonstrates the potential of utilizing low-threshold detectors to investigate new particles in beam-dump experiments, and motivates a future experiment designed specifically for this purpose.
RESUMEN
We present the first direct-detection search for sub-GeV dark matter using a new â¼2-gram high-resistivity Skipper CCD from a dedicated fabrication batch that was optimized for dark matter searches. Using 24 days of data acquired in the MINOS cavern at the Fermi National Accelerator Laboratory, we measure the lowest rates in silicon detectors of events containing one, two, three, or four electrons, and achieve world-leading sensitivity for a large range of sub-GeV dark matter masses. Data taken with different thicknesses of the detector shield suggest a correlation between the rate of high-energy tracks and the rate of single-electron events previously classified as "dark current." We detail key characteristics of the new Skipper CCDs, which augur well for the planned construction of the â¼100-gram SENSEI experiment at SNOLAB.
RESUMEN
We present new direct-detection constraints on eV-to-GeV dark matter interacting with electrons using a prototype detector of the Sub-Electron-Noise Skipper-CCD Experimental Instrument. The results are based on data taken in the MINOS cavern at the Fermi National Accelerator Laboratory. We focus on data obtained with two distinct readout strategies. For the first strategy, we read out the Skipper CCD continuously, accumulating an exposure of 0.177 g day. While we observe no events containing three or more electrons, we find a large one- and two-electron background event rate, which we attribute to spurious events induced by the amplifier in the Skipper-CCD readout stage. For the second strategy, we take five sets of data in which we switch off all amplifiers while exposing the Skipper CCD for 120 ks, and then read out the data through the best prototype amplifier. We find a one-electron event rate of (3.51±0.10)×10^{-3} events/pixel/day, which is almost 2 orders of magnitude lower than the one-electron event rate observed in the continuous-readout data, and a two-electron event rate of (3.18_{-0.55}^{+0.86})×10^{-5} events/pixel/day. We again observe no events containing three or more electrons, for an exposure of 0.069 g day. We use these data to derive world-leading constraints on dark matter-electron scattering for masses between 500 keV and 5 MeV, and on dark-photon dark matter being absorbed by electrons for a range of masses below 12.4 eV.
RESUMEN
The performance of superconducting qubits is degraded by a poorly characterized set of energy sources breaking the Cooper pairs responsible for superconductivity, creating a condition often called "quasiparticle poisoning". Both superconducting qubits and low threshold dark matter calorimeters have observed excess bursts of quasiparticles or phonons that decrease in rate with time. Here, we show that a silicon crystal glued to its holder exhibits a rate of low-energy phonon events that is more than two orders of magnitude larger than in a functionally identical crystal suspended from its holder in a low-stress state. The excess phonon event rate in the glued crystal decreases with time since cooldown, consistent with a source of phonon bursts which contributes to quasiparticle poisoning in quantum circuits and the low-energy events observed in cryogenic calorimeters. We argue that relaxation of thermally induced stress between the glue and crystal is the source of these events.