The Dark Side of EDX Tomography: Modeling Detector Shadowing to Aid 3D Elemental Signal Analysis.

Yeoh, Catriona S M; Rossouw, David; Saghi, Zineb; Burdet, Pierre; Leary, Rowan K; Midgley, Paul A

Yeoh, Catriona S M; Rossouw, David; Saghi, Zineb; Burdet, Pierre; Leary, Rowan K; Midgley, Paul A.

Afiliación

Yeoh CS; Department of Materials Science and Metallurgy,University of Cambridge,27 Charles Babbage Road,Cambridge,CB3 0FS,UK.
Rossouw D; Department of Materials Science and Metallurgy,University of Cambridge,27 Charles Babbage Road,Cambridge,CB3 0FS,UK.
Saghi Z; Department of Materials Science and Metallurgy,University of Cambridge,27 Charles Babbage Road,Cambridge,CB3 0FS,UK.
Burdet P; Department of Materials Science and Metallurgy,University of Cambridge,27 Charles Babbage Road,Cambridge,CB3 0FS,UK.
Leary RK; Department of Materials Science and Metallurgy,University of Cambridge,27 Charles Babbage Road,Cambridge,CB3 0FS,UK.
Midgley PA; Department of Materials Science and Metallurgy,University of Cambridge,27 Charles Babbage Road,Cambridge,CB3 0FS,UK.

Microsc Microanal ; 21(3): 759-64, 2015 Jun.

Article en En | MEDLINE | ID: mdl-25790959

Palabras clave

EDX tomography; detector shadowing; elemental analysis

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Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Idioma: En Revista: Microsc Microanal Año: 2015 Tipo del documento: Article País de afiliación: Reino Unido

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