Absolute Instability near the Band Edge of Traveling-Wave Amplifiers.

Hung, D M H; Rittersdorf, I M; Zhang, P; Chernin, D; Lau, Y Y; Antonsen, T M; Luginsland, J W; Simon, D H; Gilgenbach, R M

Hung, D M H; Rittersdorf, I M; Zhang, P; Chernin, D; Lau, Y Y; Antonsen, T M; Luginsland, J W; Simon, D H; Gilgenbach, R M.

Afiliación

Hung DM; Department of Nuclear Engineering and Radiological Sciences, University of Michigan, Ann Arbor, Michigan 48109, USA.
Rittersdorf IM; Department of Nuclear Engineering and Radiological Sciences, University of Michigan, Ann Arbor, Michigan 48109, USA.
Zhang P; Department of Nuclear Engineering and Radiological Sciences, University of Michigan, Ann Arbor, Michigan 48109, USA.
Chernin D; Department of Nuclear Engineering and Radiological Sciences, University of Michigan, Ann Arbor, Michigan 48109, USA.
Lau YY; Leidos Corporation, Reston, Virginia 20190, USA.
Antonsen TM; Department of Nuclear Engineering and Radiological Sciences, University of Michigan, Ann Arbor, Michigan 48109, USA.
Luginsland JW; University of Maryland, College Park, Maryland 20742, USA.
Simon DH; Air Force Office of Scientific Research, Arlington, Virginia 22203, USA.
Gilgenbach RM; Department of Nuclear Engineering and Radiological Sciences, University of Michigan, Ann Arbor, Michigan 48109, USA.

Phys Rev Lett ; 115(12): 124801, 2015 Sep 18.

Article en En | MEDLINE | ID: mdl-26430996

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Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Idioma: En Revista: Phys Rev Lett Año: 2015 Tipo del documento: Article País de afiliación: Estados Unidos

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