Using Geometry To Sense Current.

McCaughan, Adam N; Abebe, Nathnael S; Zhao, Qing-Yuan; Berggren, Karl K

McCaughan, Adam N; Abebe, Nathnael S; Zhao, Qing-Yuan; Berggren, Karl K.

Afiliación

McCaughan AN; Research Laboratory of Electronics, Massachusetts Institute of Technology , 77 Massachusetts Avenue, Cambridge, Massachusetts 02139, United States.
Abebe NS; Research Laboratory of Electronics, Massachusetts Institute of Technology , 77 Massachusetts Avenue, Cambridge, Massachusetts 02139, United States.
Zhao QY; Research Laboratory of Electronics, Massachusetts Institute of Technology , 77 Massachusetts Avenue, Cambridge, Massachusetts 02139, United States.
Berggren KK; Research Laboratory of Electronics, Massachusetts Institute of Technology , 77 Massachusetts Avenue, Cambridge, Massachusetts 02139, United States.

Nano Lett ; 16(12): 7626-7631, 2016 12 14.

Article en En | MEDLINE | ID: mdl-27960481

Palabras clave

current crowding; electronics; fluxon; memory; nondestructive readout; superconductivity; yTron

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Colección: 01-internacional Banco de datos: MEDLINE Idioma: En Revista: Nano Lett Año: 2016 Tipo del documento: Article País de afiliación: Estados Unidos

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PubMed Links

Colección: 01-internacional Banco de datos: MEDLINE Idioma: En Revista: Nano Lett Año: 2016 Tipo del documento: Article País de afiliación: Estados Unidos