Ultrafast carrier thermalization and trapping in silicon-germanium alloy probed by extreme ultraviolet transient absorption spectroscopy.

Zürch, Michael; Chang, Hung-Tzu; Kraus, Peter M; Cushing, Scott K; Borja, Lauren J; Gandman, Andrey; Kaplan, Christopher J; Oh, Myoung Hwan; Prell, James S; Prendergast, David; Pemmaraju, Chaitanya D; Neumark, Daniel M; Leone, Stephen R

Zürch, Michael; Chang, Hung-Tzu; Kraus, Peter M; Cushing, Scott K; Borja, Lauren J; Gandman, Andrey; Kaplan, Christopher J; Oh, Myoung Hwan; Prell, James S; Prendergast, David; Pemmaraju, Chaitanya D; Neumark, Daniel M; Leone, Stephen R.

Afiliación

Zürch M; Department of Chemistry, University of California, Berkeley, California 94720, USA.
Chang HT; Department of Chemistry, University of California, Berkeley, California 94720, USA.
Kraus PM; Department of Chemistry, University of California, Berkeley, California 94720, USA.
Cushing SK; Department of Chemistry, University of California, Berkeley, California 94720, USA.
Borja LJ; Department of Chemistry, University of California, Berkeley, California 94720, USA.
Gandman A; Department of Chemistry, University of California, Berkeley, California 94720, USA.
Kaplan CJ; Department of Chemistry, University of California, Berkeley, California 94720, USA.
Prell JS; Department of Chemistry, University of California, Berkeley, California 94720, USA.
Prendergast D; The Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA.

Struct Dyn ; 4(4): 044029, 2017 Jul.

Article en En | MEDLINE | ID: mdl-28653020

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Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Idioma: En Revista: Struct Dyn Año: 2017 Tipo del documento: Article País de afiliación: Estados Unidos

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