Demonstration of a Robust All-Silicon-Carbide Intracortical Neural Interface.

Bernardin, Evans K; Frewin, Christopher L; Everly, Richard; Ul Hassan, Jawad; Saddow, Stephen E

Bernardin, Evans K; Frewin, Christopher L; Everly, Richard; Ul Hassan, Jawad; Saddow, Stephen E.

Afiliación

Bernardin EK; Department of Biomedical Engineering, University of South Florida, Tampa, FL 33620, USA. ebernardin@mail.usf.edu.
Frewin CL; Department of Bioengineering, University of Texas at Dallas, Dallas, TX 75080, USA. Christopher.frewin@utdallas.edu.
Everly R; Nanotechnology Research and Education Center @ USF, Tampa, FL 33617, USA. everly@usf.edu.
Ul Hassan J; Department of Physics, Chemistry and Biology (IFM), Linköping University, SE-581 83 Linköping, Sweden. jawad.ul-hassan@liu.se.
Saddow SE; Department of Electrical Engineering, University of South Florida, Tampa, FL 33620, USA. saddow@ieee.org.

Micromachines (Basel) ; 9(8)2018 Aug 18.

Article en En | MEDLINE | ID: mdl-30424345

Palabras clave

neural interface; robust microelectrode; silicon carbide

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Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Idioma: En Revista: Micromachines (Basel) Año: 2018 Tipo del documento: Article País de afiliación: Estados Unidos

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