Pushing the boundaries of total scattering methods.
IUCrJ
; 6(Pt 2): 154-155, 2019 Mar 01.
Article
en En
| MEDLINE
| ID: mdl-30867912
Atomic pair distribution (PDF) analysis has proven to be an exceptionally robust tool for probing the structure of amorphous, crystalline and crystallographically challenged materials. This issue of IUCrJ features a significant step forward in X-ray PDF methodology for thin films, with substantial improvements in both sensitivity and time resolution.
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1
Colección:
01-internacional
Banco de datos:
MEDLINE
Idioma:
En
Revista:
IUCrJ
Año:
2019
Tipo del documento:
Article
País de afiliación:
Estados Unidos