Feasible atomic-resolution electron tomography for general crystal surfaces by quantitative reconstruction from a high-resolution image.

Shen, R H; Ming, W Q; Chen, J H; He, Y T; Mi, S B; Ma, C S

Shen, R H; Ming, W Q; Chen, J H; He, Y T; Mi, S B; Ma, C S.

Afiliación

Shen RH; Centre for High Resolution Electron Microscopy, College of Materials Science and Engineering, Hunan University, Changsha 410082, China.
Ming WQ; Centre for High Resolution Electron Microscopy, College of Materials Science and Engineering, Hunan University, Changsha 410082, China.
Chen JH; Centre for High Resolution Electron Microscopy, College of Materials Science and Engineering, Hunan University, Changsha 410082, China. Electronic address: jhchen123@hnu.edu.cn.
He YT; Centre for High Resolution Electron Microscopy, College of Materials Science and Engineering, Hunan University, Changsha 410082, China.
Mi SB; State Key Laboratory for Mechanical Behavior of Materials & School of Microelectronics, Xi'an Jiaotong University, Xi'an 710054, China.
Ma CS; State Key Laboratory for Mechanical Behavior of Materials & School of Microelectronics, Xi'an Jiaotong University, Xi'an 710054, China.

Ultramicroscopy ; 205: 27-38, 2019 Oct.

Article en En | MEDLINE | ID: mdl-31234100

Palabras clave

Atomic-resolution; Electron microscopy; Image simulation; Tomography

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Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Idioma: En Revista: Ultramicroscopy Año: 2019 Tipo del documento: Article País de afiliación: China

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