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High-Temperature Charge-Stripe Correlations in La_{1.675}Eu_{0.2}Sr_{0.125}CuO_{4}.
Wang, Qisi; Horio, M; von Arx, K; Shen, Y; John Mukkattukavil, D; Sassa, Y; Ivashko, O; Matt, C E; Pyon, S; Takayama, T; Takagi, H; Kurosawa, T; Momono, N; Oda, M; Adachi, T; Haidar, S M; Koike, Y; Tseng, Y; Zhang, W; Zhao, J; Kummer, K; Garcia-Fernandez, M; Zhou, Ke-Jin; Christensen, N B; Rønnow, H M; Schmitt, T; Chang, J.
Afiliación
  • Wang Q; Physik-Institut, Universität Zürich, Winterthurerstrasse 190, CH-8057 Zürich, Switzerland.
  • Horio M; Physik-Institut, Universität Zürich, Winterthurerstrasse 190, CH-8057 Zürich, Switzerland.
  • von Arx K; Physik-Institut, Universität Zürich, Winterthurerstrasse 190, CH-8057 Zürich, Switzerland.
  • Shen Y; State Key Laboratory of Surface Physics and Department of Physics, Fudan University, Shanghai 200433, China.
  • John Mukkattukavil D; Department of Physics and Astronomy, Uppsala University, Box 516, SE-751 20 Uppsala, Sweden.
  • Sassa Y; Department of Physics, Chalmers University of Technology, SE-412 96 Göteborg, Sweden.
  • Ivashko O; Physik-Institut, Universität Zürich, Winterthurerstrasse 190, CH-8057 Zürich, Switzerland.
  • Matt CE; Physik-Institut, Universität Zürich, Winterthurerstrasse 190, CH-8057 Zürich, Switzerland.
  • Pyon S; Swiss Light Source, Photon Science Division, Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland.
  • Takayama T; Department of Advanced Materials, University of Tokyo, Kashiwa 277-8561, Japan.
  • Takagi H; Department of Advanced Materials, University of Tokyo, Kashiwa 277-8561, Japan.
  • Kurosawa T; Department of Advanced Materials, University of Tokyo, Kashiwa 277-8561, Japan.
  • Momono N; Department of Physics, Hokkaido University, Sapporo 060-0810, Japan.
  • Oda M; Department of Physics, Hokkaido University, Sapporo 060-0810, Japan.
  • Adachi T; Department of Applied Sciences, Muroran Institute of Technology, Muroran 050-8585, Japan.
  • Haidar SM; Department of Physics, Hokkaido University, Sapporo 060-0810, Japan.
  • Koike Y; Department of Engineering and Applied Sciences, Sophia University, Tokyo 102-8554, Japan.
  • Tseng Y; Department of Applied Physics, Tohoku University, Sendai 980-8579, Japan.
  • Zhang W; Department of Applied Physics, Tohoku University, Sendai 980-8579, Japan.
  • Zhao J; Swiss Light Source, Photon Science Division, Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland.
  • Kummer K; Swiss Light Source, Photon Science Division, Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland.
  • Garcia-Fernandez M; State Key Laboratory of Surface Physics and Department of Physics, Fudan University, Shanghai 200433, China.
  • Zhou KJ; Collaborative Innovation Center of Advanced Microstructures, Nanjing 210093, China.
  • Christensen NB; European Synchrotron Radiation Facility, 71 Avenue des Martyrs, 38043 Grenoble, France.
  • Rønnow HM; Diamond Light Source, Harwell Campus, Didcot, Oxfordshire OX11 0DE, United Kingdom.
  • Schmitt T; Diamond Light Source, Harwell Campus, Didcot, Oxfordshire OX11 0DE, United Kingdom.
  • Chang J; Department of Physics, Technical University of Denmark, DK-2800 Kongens Lyngby, Denmark.
Phys Rev Lett ; 124(18): 187002, 2020 May 08.
Article en En | MEDLINE | ID: mdl-32441965
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Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Idioma: En Revista: Phys Rev Lett Año: 2020 Tipo del documento: Article País de afiliación: Suiza
Texto completo
Imprimir
XML
PubMed Links
Buscar en Google

Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Idioma: En Revista: Phys Rev Lett Año: 2020 Tipo del documento: Article País de afiliación: Suiza