On our susceptibility to external memory store manipulation: examining the influence of perceived reliability and expected access to an external store.

Pereira, April E; Kelly, Megan O; Lu, Xinyi; Risko, Evan F

Pereira, April E; Kelly, Megan O; Lu, Xinyi; Risko, Evan F.

Afiliación

Pereira AE; Department of Psychology, University of Waterloo, Waterloo, Ontario, Canada.
Kelly MO; Department of Psychology, University of Waterloo, Waterloo, Ontario, Canada.
Lu X; Department of Psychology, University of Waterloo, Waterloo, Ontario, Canada.
Risko EF; Department of Psychology, University of Waterloo, Waterloo, Ontario, Canada.

Memory ; : 1-17, 2021 Nov 10.

Article en En | MEDLINE | ID: mdl-34756153

Palabras clave

Memory; offloading; recall; recognition; reliability

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Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Idioma: En Revista: Memory Asunto de la revista: PSICOLOGIA Año: 2021 Tipo del documento: Article País de afiliación: Canadá

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