Scanning Electron Thermal Absorbance Microscopy for Light Element Detection and Atomic Number Analysis.

Lin, Ching-Che; Wang, Shih-Ming; Chen, Bo-Yi; Chi, Cheng-Hung; Chang, I-Ling; Chang, Chih-Wei

Lin, Ching-Che; Wang, Shih-Ming; Chen, Bo-Yi; Chi, Cheng-Hung; Chang, I-Ling; Chang, Chih-Wei.

Afiliación

Lin CC; Center for Condensed Matter Sciences, National Taiwan University, Taipei 10617, Taiwan.
Wang SM; Center for Condensed Matter Sciences, National Taiwan University, Taipei 10617, Taiwan.
Chen BY; Department of Mechanical Engineering, National Cheng Kung University, Tainan 70101, Taiwan.
Chi CH; Center for Condensed Matter Sciences, National Taiwan University, Taipei 10617, Taiwan.
Chang IL; Center for Condensed Matter Sciences, National Taiwan University, Taipei 10617, Taiwan.
Chang CW; Department of Mechanical Engineering, National Cheng Kung University, Tainan 70101, Taiwan.

Nano Lett ; 22(7): 2667-2673, 2022 04 13.

Article en En | MEDLINE | ID: mdl-35266397

Asunto(s)

Electrones; Microscopía Electrónica de Rastreo

Palabras clave

atomic number; bolometer; electron microscopy; thermal absorbance

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Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Asunto principal: Electrones Tipo de estudio: Diagnostic_studies Idioma: En Revista: Nano Lett Año: 2022 Tipo del documento: Article País de afiliación: Taiwán

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