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Patterning of graphene using wet etching with hypochlorite and UV light.
Zhang, Minfang; Yang, Mei; Okigawa, Yuki; Yamada, Takatoshi; Nakajima, Hideaki; Iizumi, Yoko; Okazaki, Toshiya.
Afiliación
  • Zhang M; CNT Application Research Center, National Institute of Advanced Industrial Science and Technology (AIST), Higashi 1-1-1, Tsukuba, Japan. m-zhang@aist.go.jp.
  • Yang M; CNT Application Research Center, National Institute of Advanced Industrial Science and Technology (AIST), Higashi 1-1-1, Tsukuba, Japan.
  • Okigawa Y; Nanomaterials Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Higashi 1-1-1, Tsukuba, Japan.
  • Yamada T; Nanomaterials Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Higashi 1-1-1, Tsukuba, Japan. takatoshi-yamada@aist.go.jp.
  • Nakajima H; CNT Application Research Center, National Institute of Advanced Industrial Science and Technology (AIST), Higashi 1-1-1, Tsukuba, Japan.
  • Iizumi Y; CNT Application Research Center, National Institute of Advanced Industrial Science and Technology (AIST), Higashi 1-1-1, Tsukuba, Japan.
  • Okazaki T; CNT Application Research Center, National Institute of Advanced Industrial Science and Technology (AIST), Higashi 1-1-1, Tsukuba, Japan. toshi-okazaki@aist.go.jp.
Sci Rep ; 12(1): 4541, 2022 Mar 16.
Article en En | MEDLINE | ID: mdl-35296771
ABSTRACT
Graphene patterning via etching is important for enhancing or controling the properties of devices and supporting their applications in micro- and nano-electronic fields. Herein, we present a simple, low-cost, and scalable wet etching method for graphene patterning. The technique uses hypochlorite solution combined with ultraviolet light irradiation to rapidly remove unwanted graphene areas from the substrate. Raman spectroscopy, atomic force microscopy, scanning electron microscopy, and optical microscopy results showed that well-patterned graphene with micrometer scale regions was successfully prepared. Furthermore, graphene field effect transistor arrays were fabricated, and the obtained devices exhibited good current-voltage characteristics, with maximum mobility of ~ 1600 cm2/Vs, confirming the feasibility of the developed technique.

Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Idioma: En Revista: Sci Rep Año: 2022 Tipo del documento: Article País de afiliación: Japón

Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Idioma: En Revista: Sci Rep Año: 2022 Tipo del documento: Article País de afiliación: Japón