Study of Size, Shape, and Etch pit formation in InAs/InP Droplet Epitaxy Quantum Dots.

Gajjela, Raja S R; van Venrooij, Niels R S; da Cruz, Adonai R; Skiba-Szymanska, Joanna; Stevenson, R Mark; Shields, Andrew J; Pryor, Craig E; Koenraad, Paul M

Gajjela, Raja S R; van Venrooij, Niels R S; da Cruz, Adonai R; Skiba-Szymanska, Joanna; Stevenson, R Mark; Shields, Andrew J; Pryor, Craig E; Koenraad, Paul M.

Afiliación

Gajjela RSR; Department of Applied Physics, Eindhoven University of Technology, Eindhoven 5612 AZ, The Netherlands.
van Venrooij NRS; Department of Applied Physics, Eindhoven University of Technology, Eindhoven 5612 AZ, The Netherlands.
da Cruz AR; Department of Applied Physics, Eindhoven University of Technology, Eindhoven 5612 AZ, The Netherlands.
Skiba-Szymanska J; Toshiba Europe Limited, Cambridge Research Laboratory, 208 Science Park, Milton Road, Cambridge CB4 0GZ, United Kingdom.
Stevenson RM; Toshiba Europe Limited, Cambridge Research Laboratory, 208 Science Park, Milton Road, Cambridge CB4 0GZ, United Kingdom.
Shields AJ; Toshiba Europe Limited, Cambridge Research Laboratory, 208 Science Park, Milton Road, Cambridge CB4 0GZ, United Kingdom.
Pryor CE; Department of Physics and Astronomy, Optical Science and Technology Center, University of Iowa, Iowa City, Iowa IA-52242, United States of America.
Koenraad PM; Department of Applied Physics, Eindhoven University of Technology, Eindhoven 5612 AZ, The Netherlands.

Nanotechnology ; 33(30)2022 May 06.

Article en En | MEDLINE | ID: mdl-35395644

Palabras clave

InAs etch pits; X-STM; droplet epitaxy; morphology; quantum dots

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Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Idioma: En Revista: Nanotechnology Año: 2022 Tipo del documento: Article País de afiliación: Países Bajos

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