High-Speed Micro-Particle Motion Monitoring Based on Continuous Single-Frame Multi-Exposure Technology.

Wang, Wei; Xue, Weiwei; Wu, Shufan; Mu, Zhongcheng; Yi, Jiyuan; Tang, Andrew J

Wang, Wei; Xue, Weiwei; Wu, Shufan; Mu, Zhongcheng; Yi, Jiyuan; Tang, Andrew J.

Afiliación

Wang W; School of Aeronautics and Astronautics, Shanghai Jiao Tong University, Shanghai 200240, China.
Xue W; CAS Key Laboratory of Mechanical Behavior and Design of Material, Department of Modern Mechanics, University of Science and Technology of China, Hefei 230027, China.
Wu S; School of Aeronautics and Astronautics, Shanghai Jiao Tong University, Shanghai 200240, China.
Mu Z; School of Aeronautics and Astronautics, Shanghai Jiao Tong University, Shanghai 200240, China.
Yi J; School of Aeronautics and Astronautics, Shanghai Jiao Tong University, Shanghai 200240, China.
Tang AJ; School of Aerospace, Mechanical and Mechatronic Engineering, The University of Sydney, Camperdown, NSW 2006, Australia.

Materials (Basel) ; 15(11)2022 May 29.

Article en En | MEDLINE | ID: mdl-35683170

Palabras clave

high-frequency light-emitting diode flash; micro-particles' impact; motion monitoring; single-frame multiple-exposure

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Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Idioma: En Revista: Materials (Basel) Año: 2022 Tipo del documento: Article País de afiliación: China

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