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Basic principles and optical system design of 17.48 keV high-throughput modified Wolter x-ray microscope.
Li, Yaran; Li, Wenjie; Chen, Liang; Ma, Huanzhen; Xu, Xinye; Xu, Jie; Wang, Xin; Mu, Baozhong.
Afiliación
  • Li Y; Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China.
  • Li W; School of Physics Science and Engineering, Tongji University, Shanghai 200092, China.
  • Chen L; School of Physics Science and Engineering, Tongji University, Shanghai 200092, China.
  • Ma H; School of Physics and Optoelectronic Engineering, Hangzhou Institute for Advanced Study, UCAS, Hangzhou 310024, China.
  • Xu X; School of Physics Science and Engineering, Tongji University, Shanghai 200092, China.
  • Xu J; School of Physics Science and Engineering, Tongji University, Shanghai 200092, China.
  • Wang X; School of Physics Science and Engineering, Tongji University, Shanghai 200092, China.
  • Mu B; School of Physics Science and Engineering, Tongji University, Shanghai 200092, China.
Rev Sci Instrum ; 93(9): 093526, 2022 Sep 01.
Article en En | MEDLINE | ID: mdl-36182515

Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Idioma: En Revista: Rev Sci Instrum Año: 2022 Tipo del documento: Article País de afiliación: China

Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Idioma: En Revista: Rev Sci Instrum Año: 2022 Tipo del documento: Article País de afiliación: China