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Effective lifetime of non-equilibrium carriers in semiconductors from non-adiabatic molecular dynamics simulations.
Wang, Shanshan; Huang, Menglin; Wu, Yu-Ning; Chu, Weibin; Zhao, Jin; Walsh, Aron; Gong, Xin-Gao; Wei, Su-Huai; Chen, Shiyou.
Afiliación
  • Wang S; State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, China.
  • Huang M; Key Laboratory of Polar Materials and Devices (MOE) and Department of Electronics, East China Normal University, Shanghai, China.
  • Wu YN; State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, China.
  • Chu W; Key Laboratory of Polar Materials and Devices (MOE) and Department of Electronics, East China Normal University, Shanghai, China.
  • Zhao J; Key Laboratory of Computational Physical Sciences (MOE) and Institute of Computational Physical Sciences, Fudan University, Shanghai, China.
  • Walsh A; Department of Physics and ICQD/Hefei National Research Center for Physical Sciences at the Microscale, University of Science and Technology of China, Hefei, Anhui, China.
  • Gong XG; Department of Materials, Imperial College London, London, UK.
  • Wei SH; Key Laboratory of Computational Physical Sciences (MOE) and Institute of Computational Physical Sciences, Fudan University, Shanghai, China.
  • Chen S; Shanghai Qi Zhi Institute, Shanghai, China.
Nat Comput Sci ; 2(8): 486-493, 2022 Aug.
Article en En | MEDLINE | ID: mdl-38177803
ABSTRACT
The lifetimes of non-equilibrium charge carriers in semiconductors calculated using non-adiabatic molecular dynamics often differ from experimental results by orders of magnitude. By revisiting the definition of carrier lifetime, we report a systematic procedure for calculating the effective carrier lifetime in semiconductor crystals under realistic conditions. The consideration of all recombination mechanisms and the use of appropriate carrier and defect densities are crucial to bridging the gap between modeling and measurements. Our calculated effective carrier lifetime of CH3NH3PbI3 agrees with experiments, and is limited by band-to-band radiative recombination and Shockley-Read-Hall defect-assisted non-radiative recombination, whereas the band-to-band non-radiative recombination is found to be negligible. The procedure is further validated by application to the compound semiconductors CdTe and GaAs, and thus can be applied in carrier lifetime simulations in other material systems.
Asunto(s)

Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Asunto principal: Compuestos de Cadmio / Puntos Cuánticos Idioma: En Revista: Nat Comput Sci Año: 2022 Tipo del documento: Article País de afiliación: China

Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Asunto principal: Compuestos de Cadmio / Puntos Cuánticos Idioma: En Revista: Nat Comput Sci Año: 2022 Tipo del documento: Article País de afiliación: China