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Metal-assisted chemical etching beyond Si: applications to III-V compounds and wide-bandgap semiconductors.
Znati, Sami; Wharwood, Juwon; Tezanos, Kyle G; Li, Xiuling; Mohseni, Parsian K.
Afiliación
  • Znati S; Microsystem Engineering, Rochester Institute of Technology, Rochester, NY 16423, USA. pkmohseni@rit.edu.
  • Wharwood J; NanoPower Research Laboratories, Rochester Institute of Technology, Rochester, NY 14623, USA.
  • Tezanos KG; NanoPower Research Laboratories, Rochester Institute of Technology, Rochester, NY 14623, USA.
  • Li X; Department of Electrical and Computer Engineering, Howard University, Washington, DC 20059, USA.
  • Mohseni PK; NanoPower Research Laboratories, Rochester Institute of Technology, Rochester, NY 14623, USA.
Nanoscale ; 16(23): 10901-10946, 2024 Jun 13.
Article en En | MEDLINE | ID: mdl-38804075
ABSTRACT
Metal-assisted chemical etching (MacEtch) has emerged as a versatile technique for fabricating a variety of semiconductor nanostructures. Since early investigations in 2000, research in this field has provided a deeper understanding of the underlying mechanisms of catalytic etching processes and enabled high control over etching conditions for diverse applications. In this Review, we present an overview of recent developments in the application of MacEtch to nanomanufacturing and processing of III-V based semiconductor materials and other materials beyond Si. We highlight the key findings and developments in MacEtch as applied to GaAs, GaN, InP, GaP, InGaAs, AlGaAs, InGaN, InGaP, SiC, ß-Ga2O3, and Ge material systems. We further review a series of active and passive devices enabled by MacEtch, including light-emitting diodes (LEDs), field-effect transistors (FETs), optical gratings, sensors, capacitors, photodiodes, and solar cells. By reviewing demonstrated control of morphology, optimization of etch conditions, and catalyst-material combinations, we aim to distill the current understanding of beyond-Si MacEtch mechanisms and to provide a bank of reference recipes to stimulate progress in the field.

Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Idioma: En Revista: Nanoscale Año: 2024 Tipo del documento: Article País de afiliación: Estados Unidos

Texto completo: 1 Colección: 01-internacional Banco de datos: MEDLINE Idioma: En Revista: Nanoscale Año: 2024 Tipo del documento: Article País de afiliación: Estados Unidos