Digital in-line holography with femtosecond VUV radiation provided by the free-electron laser FLASH.

Femtosecond vacuum ultraviolet (VUV) radiation provided by the free-electron laser FLASH was used for digital in-line holographic microscopy and applied to image particles, diatoms and critical point dried fibroblast cells. To realize the classical in-line Gabor geometry, a 1 microm pinhole was used as spatial filter to generate a divergent light cone with excellent pointing stability. At a fundamental wavelength of 8 nm test objects such as particles and diatoms were imaged at a spatial resolution of 620 nm. In order to demonstrate the applicability to biologically relevant systems, critical point dried rat embryonic fibroblast cells were for the first time imaged with free-electron laser radiation.

Hard X ray holographic diffraction imaging.

We determine the absolute electron density of a lithographically grown nanostructure with 25 nm resolution by combining hard x-ray Fourier transform holography with iterative phase retrieval methods. While holography immediately reveals an unambiguous image of the object, we deploy in addition iterative phase retrieval algorithms for pushing the resolution close to the diffraction limit. The use of hard (8 keV) x rays eliminates practically all constraints on sample environment and enables a destruction-free investigation of relatively thick or buried samples, making holographic diffraction imaging a very attractive tool for materials science. We note that the technique is ideally suited for subpicosecond imaging that will become possible with the emerging hard x-ray free-electron lasers.

Detrended fluctuation analysis in x-ray photon correlation spectroscopy for determining coarsening dynamics in alloys.

We study the dynamics of precipitate coarsening in phase-separating alloys at late stages of phase separation by x-ray photon correlation spectroscopy (XPCS). For analyzing time series of fluctuating speckle intensities from small-angle scattering of coherent x rays, the method of detrended fluctuation analysis (DFA), which is ideal for determining power-law correlations, is applied. We discuss the application of DFA with respect to XPCS data by means of simulated time series. In particular, the effects of different signal-to-noise ratios are examined. Results from measurements of the two model systems Al-6 at. % Ag at 140 degrees C and Al-9 at. % Zn at 0 degrees C are presented. Since the DFA effectively removes adulterating trends in the data, quantitative agreement with Monte Carlo simulations is obtained. It is verified that two different coarsening mechanisms are predominant in the two systems--coarsening either by diffusion of single atoms or by movement of whole precipitates.

Transient interface sharpening in miscible alloys.

We observed that diffuse interfaces sharpen rather than broaden in completely miscible ideal binary systems. This is shown in situ during heat treatments at gradually increasing temperatures by scattering of synchrotron radiation in coherent Mo/V multilayers containing initially diffuse interfaces. This effect provides a useful tool for the improvement of interfaces and offers a way to fabricate better x-ray or neutron mirrors, microelectronic devices, or multilayers with giant magnetic resistance.