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1.
Microb Genom ; 7(8)2021 08.
Artigo em Inglês | MEDLINE | ID: mdl-34448692

RESUMO

Ochrobactrum pseudogrignonense (newly named Brucella pseudogrignonensis) is an emerging pathogen in immunodeficient and immunocompetent patients. Most documented cases associated with Ochrobactrum are frequently catheter-related and exhibit wide-spectrum ß-lactam resistance. Misidentification of this pathogen using commercial bacterial identification kits is common. We identified a case of O. pseudogrignonense infection associated with cholelithiasis. The O. pseudogrignonense genome was sequenced and reconstructed using a Nanopore and Illumina hybrid strategy. A novel blaOXA-919 divergent from existing OXA members was identified and subsequent analysis revealed its existence in all available O. pseudogrignonense genomes, which forms a new phylogenetic subgroup distinct from other OXA clusters. Further analysis demonstrated the presence of the novel blaOXA-919 in the chromosome of several other Ochrobactrum species. Our study indicated that Ochrobactrum chromosomes may be a reservoir of blaOXA-919 ß-lactamases.


Assuntos
Brucella/classificação , Brucella/genética , Genômica , Ochrobactrum/classificação , Ochrobactrum/genética , Idoso de 80 Anos ou mais , Humanos , Masculino , Filogenia , Sequenciamento Completo do Genoma , Resistência beta-Lactâmica/genética , beta-Lactamases/genética
2.
Ultramicroscopy ; 224: 113266, 2021 May.
Artigo em Inglês | MEDLINE | ID: mdl-33813341

RESUMO

This paper reports a novel investigation of the voltage modulation efficiency (VME) in scanning capacitance microscopy (SCM). A signal intensity model was used to define the VME, which is dependent on the impedance components in an SCM setup. In SCM, the VME was found to play a key mediating role in the close relationship between the signal intensity and the modulation voltage, providing an indicator for the surface treatment and the back-contact process of an SCM specimen. We observed that, for silicon-based specimens, ultraviolet-assisted oxidation and microwave annealing improved the specimen surface and the back-contact, respectively, which increased the VME. It was also found that a high modulation voltage and a large back-contact area may induce a significant stray capacitance around the conductive tip and, hence, lower the VME. The VME degradation not only decreased the SCM signal intensity but also reduced the image contrast in the regions with high carrier concentrations. In addition, our experimental results further revealed that the signal intensity model also provided a promising opportunity to establish a precise and quantitative method for measuring the thickness of insulating layers.

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