1.
Opt Lett
; 38(19): 3704-7, 2013 Oct 01.
Artigo
em Inglês
| MEDLINE
| ID: mdl-24081031
RESUMO
The change in phase of the free space terahertz (THz) electric field as a sample of material introduced into the THz beampath of a CW THz system is measured and used to calculate the index of refraction of materials at 250 GHz.