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1.
J Phys Condens Matter ; 24(11): 115403, 2012 Mar 21.
Artigo em Inglês | MEDLINE | ID: mdl-22356832

RESUMO

The extended x-ray absorption fine structure (EXAFS) has been measured at both the K edges of cadmium and tellurium in CdTe, from liquid helium to room temperature, in order to investigate the local thermodynamic behaviour. The temperature dependences of the structural parameters obtained from the separate analysis of the two edges are perfectly consistent. The positive contribution to the thermal expansion due to the bond stretching and the negative contribution due to the tension effects are disentangled and quantified in terms of the bond thermal expansion and the perpendicular mean square relative displacement. The comparison with previous EXAFS results for Ge and CuCl shows that relevant correlations can be established between a number of local parameters measured by means of EXAFS and the properties of the lattice negative thermal expansion of tetrahedrally bonded semiconductors. The effective force constants derived from the EXAFS are compared with the force constants of a valence force field model.

2.
Phys Rev Lett ; 101(15): 155901, 2008 Oct 10.
Artigo em Inglês | MEDLINE | ID: mdl-18999615

RESUMO

A large number of AgI-based fast-ion-conducting glasses have been investigated by K-iodine extended x-ray absorption fine structure spectroscopy (EXAFS) measurements at liquid nitrogen temperature. A general correlation between the I-Ag distance measured by EXAFS and the glass activation energy for dc ionic conductivity has been found out: glasses with longer I-Ag distances display higher ionic conductivity, independently from the chemical composition of their host glassy matrix. This behavior can be related to the progressive increase of the "pathway volume" for ionic conduction.

3.
Phys Rev Lett ; 100(5): 055901, 2008 Feb 08.
Artigo em Inglês | MEDLINE | ID: mdl-18352392

RESUMO

Extended x-ray absorption fine structure has been measured on two powdered samples of (70)Ge and (76)Ge as a function of temperature from 20 to 300 K. The effect of isotopic mass difference on the amplitude of relative atomic vibrations is neatly evidenced by the temperature dependence of the difference of Debye-Waller factors. The isotopic effect is also detected on the difference of nearest-neighbor average ineratomic distances, thanks to a resolution better than 10 fm.

4.
Phys Rev Lett ; 89(2): 025503, 2002 Jul 08.
Artigo em Inglês | MEDLINE | ID: mdl-12097002

RESUMO

The local thermal behavior of the Ag(2)O framework structure has been studied by extended x-ray absorption fine structure. The average Ag-O nearest-neighbor distance expands upon heating, while the Ag-Ag next-nearest-neighbor distance contracts. An original implementation of the cumulant analysis shows that the Ag-O expansion is a joint effect of potential anharmonicity and geometrical deformation of the Ag(4)O basic tetrahedral units. Accordingly, the negative thermal expansion of the lattice parameter in Ag(2)O cannot be explained uniquely in terms of rigid unit modes.

5.
J Synchrotron Radiat ; 6(Pt 3): 253-4, 1999 May 01.
Artigo em Inglês | MEDLINE | ID: mdl-15263268
7.
J Synchrotron Radiat ; 4(Pt 4): 243-55, 1997 Jul 01.
Artigo em Inglês | MEDLINE | ID: mdl-16699237

RESUMO

The EXAFS Debye-Waller factor depends on the correlation of atomic motion and can yield original information on the vibrational dynamics of crystalline solids. In this paper an introductory treatment of thermal disorder in EXAFS, based on thc cumulant approach, is given. Thc general relation between mean-square relative displacement (MSRD) measured by EXAFS and atomic thermal vibrations in harmonic approximation is explored. Strengths and limitations of the phenomenological Einstein- and Debye-correlated models are discussed. Some of the most significant results so far obtained are reviewed. A relatively simple method for estimating anharmonic corrections to the MSRD is proposed.

8.
J Synchrotron Radiat ; 3(Pt 5): 213-9, 1996 Sep 01.
Artigo em Inglês | MEDLINE | ID: mdl-16702681

RESUMO

The properties of PIN silicon diodes as X-ray detectors for EXAFS measurements with synchrotron radiation have been investigated. Electronic stability, linearity and noise current have been analyzed. The effects of diffraction peaks resulting from the crystalline nature of the diodes have been minimized by mounting the diodes on a simple device that continuously changes its orientation by a few degrees with respect to the X-ray beam. An accurate comparison between EXAFS signals monitored by ionization chambers and PIN photodiodes is presented. It is shown that good-quality EXAFS measurements with PIN photodiodes are possible if diffraction effects are eliminated.

9.
Phys Rev B Condens Matter ; 52(15): 11034-11043, 1995 Oct 15.
Artigo em Inglês | MEDLINE | ID: mdl-9980201
12.
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