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Nanomaterials (Basel) ; 11(1)2021 Jan 06.
Artigo em Inglês | MEDLINE | ID: mdl-33419078

RESUMO

We consider two series of experimental setups of multilayered Ag/ZnO thin films with varying surface morphologies given by atomic force microscopy images. The absorption loss under diffuse scattering is studied theoretically by applying a combination of the scattering matrix approach with diffraction theory for randomly nanotextured interfaces. Our modeling is in excellent agreement with the respective measurements. The theoretical approach is applicable to a wide range of wavelengths, surface morphologies, and materials for both measured and computed rough surface morphologies.

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