RESUMO
SiGe nanoparticles dispersed in a dielectric matrix exhibit properties different from those of bulk and have shown great potential in devices for application in advanced optoelectronics. Annealing is a common fabrication step used to increase crystallinity and to form nanoparticles in such a system. A frequent downside of such annealing treatment is the formation of insulating SiO2 layer at the matrix/SiGe interface, degrading the optical properties of the structure. An annealing process that could bypass this downside would therefore be of great interest. In this work, a short-time furnace annealing of a SiGe/TiO2 system is applied to obtain SiGe nanoparticles without formation of the undesired SiO2 layer between the dielectric matrix (TiO2) and SiGe. The structures were prepared by depositing alternate layers of TiO2 and SiGe films, using direct-current magnetron sputtering technique. A wide range spectral response with a response-threshold up to â¼1300 nm was obtained, accompanied with an increase in photo-response of more than two-orders of magnitude. Scanning electron microscopy, transmission electron microscopy, energy-dispersive x-ray spectroscopy and grazing incidence x-ray diffraction were used to analyze the morphological changes in respective structures. Photoconductive properties were studied by measuring photocurrent spectra using applied dc-voltages at various temperatures.
RESUMO
Resonant photon tunneling was investigated experimentally in multilayer structures containing a high-contrast (TiO(2)/SiO(2)) Bragg mirror capped with a semitransparent gold film. Transmission via a fundamental cavity resonance was compared with transmission via the Tamm plasmon polariton resonance that appears at the interface between a metal film and a one-dimensional photonic bandgap structure. The Tamm-plasmon-mediated transmission exhibits a smaller dependence on the angle and polarization of the incident light for similar values of peak transmission, resonance wavelength, and finesse. Implications for transparent electrical contacts based on resonant tunneling structures are discussed.
RESUMO
The velocities of Ar+ and Xe+ ions near the presheath-sheath boundary in an Ar/Xe discharge are studied by particle-in-cell Monte Carlo simulation. For a pure argon discharge the argon ion has almost the same velocity profile as it does in the mixture of argon and xenon. Similarly, for a xenon discharge the xenon ion has almost the same velocity profile as it does in the mixture of argon and xenon. The ion speed at the sheath-presheath boundary is the same for an ion in a pure argon or xenon discharge and for the same ion in a mixture of argon and xenon. We conclude that, in our simulation, each ion reaches its own Bohm speed at the presheath-sheath interface.
RESUMO
Electrostatic probes or Langmuir probes are the most common diagnostic tools in plasma discharges. The second derivative of the Langmuir probe I-V characteristic is proportional to the electron energy distribution function. Determining the second derivative accurately requires some method of noise suppression. We compare the Savitzky-Golay filter, the Gaussian filter, and polynomial fitting to the Blackman filter for digitally smoothing simulated and measured I-V characteristics. We find that the Blackman filter achieves the most smoothing with minimal distortion for noisy data.
RESUMO
We describe a versatile three gun magnetron sputtering system with a custom made sample holder for in situ electrical resistance measurements, both during film growth and ambient changes on film electrical properties. The sample holder allows for the preparation of patterned thin film structures, using up to five different shadow masks without breaking vacuum. We show how the system is used to monitor the electrical resistance of thin metallic films during growth and to study the thermodynamics of hydrogen uptake in metallic thin films. Furthermore, we demonstrate the growth of thin film capacitors, where patterned films are created using shadow masks.
