Total-reflection inelastic X-ray scattering from a 10-nm thick La0.6Sr0.4CoO3 thin film.

To study equilibrium changes in composition, valence, and electronic structure near the surface and into the bulk, we demonstrate the use of a new approach, total-reflection inelastic x-ray scattering, as a sub-keV spectroscopy capable of depth profiling chemical changes in thin films with nanometer resolution. By comparing data acquired under total x-ray reflection and penetrating conditions, we are able to separate the O K-edge spectra from a 10 nm La0.6Sr0.4CoO3 thin film from that of the underlying SrTiO3 substrate. With a smaller wavelength probe than comparable soft x-ray absorption measurements, we also describe the ability to easily access dipole-forbidden final states, using the dramatic evolution of the La N4,5 edge with momentum transfer as an example.

Atomic scale characterization of the Pt/TiO2 interface.

We present results from an investigation of the Pt/TiO(2) catalyst system using a combination of Z-contrast imaging and electron energy loss spectroscopy (EELS) in the scanning transmission electron microscope. Evidence of a strong interaction between the Pt particles and the support is found to be dependent on the Pt cluster size, being manifested either as an encapsulation of the Pt particles by the support or a distortion of the structure of the Pt particles. In the case of clusters that are only a few atoms in size, we show direct evidence of an epitaxial nucleation relationship between Pt and Titania. The results also show unexpectedly that Pt particles exhibit a preferential nucleation on rutile rather than anatase.