RESUMO
BACKGROUND: The radionuclide Ga-68 is commonly used in nuclear medicine, specifically in positron emission tomography (PET). Recently, the interest in producing Ga-68 by cyclotron irradiation of [68Zn]Zn nitrate liquid targets is increasing. However, current purification methods of Ga-68 from the target solution consist of multi-step procedures, thus, leading to a significant loss of activity through natural decay. Additionally, several processing steps are needed to recycle the costly, enriched target material. RESULTS: To eventually allow switching from batch to continuous production, conventional batch extraction and membrane-based microfluidic extraction were compared. In both approaches, Ga-68 was extracted using N-benzoyl-N-phenylhydroxylamine in chloroform as the organic extracting phase. Extraction efficiencies of up to 99.5% ± 0.6% were achieved within 10 min, using the batch approach. Back-extraction of Ga-68 into 2 M HCl was accomplished within 1 min with efficiencies of up to 94.5% ± 0.6%. Membrane-based microfluidic extraction achieved 99.2% ± 0.3% extraction efficiency and 95.8% ± 0.8% back-extraction efficiency into 6 M HCl. When executed on a solution irradiated with a 13 MeV cyclotron at TRIUMF, Canada, comparable efficiencies of 97.0% ± 0.4% were achieved. Zn contamination in the back-extracted Ga-68 solution was found to be below 3 ppm. CONCLUSIONS: Microfluidic solvent extraction is a promising method in the production of Ga-68 achieving high efficiencies in a short amount of time, potentially allowing for direct target recycling.
RESUMO
Sub-aperture fabrication techniques such as diamond turning, ion beam figuring, and bonnet polishing are indispensable tools in today's optical fabrication chain. Each of these tools addresses different figure and roughness imperfections corresponding to a broad spatial frequency range. Their individual effects, however, cannot be regarded as completely independent from each other due to the concurrent formation of form and finish errors, particularly in the mid-spatial frequency (MSF) region. Deterministic Zernike polynomials and statistical power spectral density (PSD) functions are often used to represent form and finish errors, respectively. Typically, both types of surface errors are treated separately when their impact on optical performance is considered: (i) wave aberrations caused by figure errors and (ii) stray light resulting from surface roughness. To fill the gap between deterministic and statistical descriptions, a generalized surface description is of great importance for bringing versatility to the entire optical fabrication chain by enabling easy and quick exchange of surface topography data between three disciplines: optical design, manufacturing, and characterization. In this work, we present a surface description by stitching the amplitude and unwrapped phase spectra of several surface topography measurements at different magnifications. An alternative representation of surface errors at different regimes is proposed, allowing us to bridge the gap between figure and finish as well as to describe the well-known MSF errors.
