Giant change of MoS2 optical properties along amorphous-crystalline transition: broadband spectroscopic study including the NIR therapeutic window.

This work deals with an ellipsometric study of magnetron sputtered thin MoS2 films. The evolution of the UV-VIS-NIR optical properties of as-deposited and subsequently annealed films is thoughtfully investigated, covering amorphous, amorphous relaxed, partially crystallized, and polycrystallized MoS2 films. The transition from the mixed 1T'@2H local order in the amorphous phase toward the long-range 2H order in the polycrystalline phase is systematically correlated with film optical properties. The early stage of a few-layer 2H ordering toward the 2H bulk-like polycrystalline structure during annealing is evidenced through the energy shift of MoS2 prominent excitonic peaks. A considerable change in optical response between metallic (amorphous) and semiconducting (polycrystalline) MoS2 phases is reported and presented in terms of dielectric permittivity and normal reflectance NIR-VIS-UV spectra. Results of light-heat conversion in the NIR therapeutic window show so far uncovered potential of amorphous MoS2 as an agent for photothermal therapy. Spectroscopic ellipsometry provided sensitive characterization disclosing essential results complementary to other characterization tools. The benefit of these results is expected to be employed in fundamental and application-motivated research, for example, in the field of phase change materials, photothermal cancer therapy, and magneto-optical study of magnetic ordering in metal transition dichalcogenides, among others.

Surface modification by high-energy heavy-ion irradiation in various crystalline ZnO facets.

Self-assembled surface nanoscale structures on various ZnO facets are excellent templates for the deposition of semiconductor quantum dots and manipulation with surface optical transparency. In this work, we have modified the surface of c-, m- and a-plane ZnO single-crystals by high-energy W-ion irradiation with an energy of 27 MeV to observe the aspects of surface morphology on the optical properties. We kept ion fluences in the range from 5 × 109 cm-2 to 5 × 1011 cm-2 using the mode of single-ion implantation and the overlapping impact mode to see the effect of various regimes on surface modification. Rutherford backscattering spectroscopy in the channeling mode (RBS-C) and Raman spectroscopy have identified a slightly growing Zn-sublattice disorder in the irradiated samples with a more significant enhancement for the highest irradiation fluence. Simultaneously, the strong suppression of the main Raman modes and the propagation of the modes corresponding to polar Zn-O vibrations indicate disorder mainly in the O-sublattice in non-polar facets. The surface morphology, analysed by atomic force microscopy (AFM), shows significant changes after ion irradiation. The c- and a-plane ZnO exhibit the formation of small grains on the surface. The m-plane ZnO forms a sponge-like surface for lower fluences and grains for the highest fluence. The surface roughness itself increases with the irradiation fluence as shown by AFM measurement as well as spectroscopic ellipsometry (SE) analysis. The damage caused by high-energy irradiation leads to non-radiative processes and suppression of the near-band-edge peak as well as the deep-level emission peak in the photoluminescence spectra. Furthermore, the refraction index n and the extinction coefficient k of irradiated samples, determined by SE, have features corresponding to the particular exciton states blurred and are slightly lower in the optical bandgap region especially for the polar c-plane ZnO facet.

Optical and magneto-optical behavior of Cerium Yttrium Iron Garnet thin films at wavelengths of 200-1770 nm.

Magneto-optical cerium-substituted yttrium iron garnet (Ce:YIG) thin films display Faraday and Kerr rotation (rotation of light polarisation upon transmission and reflection, respectively) as well as a nonreciprocal phase shift due to their non-zero off-diagonal permittivity tensor elements, and also possess low optical absorption in the near-infrared. These properties make Ce:YIG useful in providing nonreciprocal light propagation in integrated photonic circuits, which is essential for accomplishing energy-efficient photonic computation and data transport architectures. In this study, 80 nm-thick Ce:YIG films were grown on Gadolinium Gallium Garnet substrates with (100), (110) and (111) orientations using pulsed laser deposition. The films had bulk-like structural and magnetic quality. Faraday and Kerr spectroscopies along with spectroscopic ellipsometry were used to deduce the complete permittivity tensor of the films in the ultraviolet, visible and near-infrared spectral region, and the magneto-optical figure of merit as a function of wavelength was determined. The samples showed the highest IR Faraday rotation reported for thin films of Ce:YIG, which indicates the importance of this material in development of nonreciprocal photonic devices.

Complete Permittivity Tensor in Sputtered CuFe2O4 Thin Films at Photon Energies between 2 and 5 eV.

This work is devoted to the systematic study of the optical and magneto-optical properties of sputter deposited CuFe2O4 thin films in the photon energy region between 2 and 5 eV using spectroscopic ellipsometry and magneto-optical Kerr spectroscopy. The spectral dependence of both the diagonal and off-diagonal elements of the permittivity tensor is determined. A complete picture about the electron transitions in CuFe2O4 is suggested in the frame of intervalence charge transfer and intersublattice charge transfer transitions. The effect of deposition conditions and post-deposition treatment in CuFe2O4 films upon the optical and magneto-optical properties is discussed.

Evaluation of the quality of Permalloy gratings by diffracted magneto-optical spectroscopy.

Magneto-optical Kerr effect (MOKE) spectroscopy in the -1st diffraction order with p-polarized incidence is applied to study arrays of submicron Permalloy wires at polar magnetization. A theoretical approach combining two methods, the local modes method neglecting the edge effects of wires and the rigorous coupled wave analysis, is derived to evaluate the diffraction losses due to irregularities of the wire edges. A new parameter describing the quality of the edges is defined according to their contribution in the diffracted MOKE. The quality factor, evaluated for two different samples, is successfully compared with irregularities visible on atomic force microscopy pictures.