Local thickness and composition measurements from scanning convergent-beam electron diffraction of a binary non-crystalline material obtained by a pixelated detector.

The nanometer-scale spatial distributions of local thickness or composition of noncrystalline materials are generally measured by spectroscopy with scanning transmission electron microscopy (STEM). Since spectroscopy requires a high electron dose and causes irradiation damage, alternative non-spectroscopic methods are required to measure the local thickness or composition of electron-sensitive noncrystalline materials. Here, we focus on the radial distribution function (RDF) of the electron diffraction of non-crystalline materials. We confirm that the RDF of the electron diffraction obtained by simulation contains information on the thickness and composition. Next, we demonstrate the determination of both thickness and composition from experimentally obtained RDFs. Although some constraints are required, we determine the local thickness and composition of a BaO-SiO2 glass sample by comparing the RDFs of diffraction measured by a high-speed pixelated detector with those of the simulated diffractions. Collaterally, this determination method can improve the quality of STEM images.

Imaging properties of bright-field and annular-dark-field scanning confocal electron microscopy: II. point spread function analysis.

The imaging properties of bright field and annular dark field scanning confocal electron microscopy (BF-SCEM and ADF-SCEM) are discussed based on their point spread functions (PSFs) in comparison with multislice simulations. Although the PSFs of BF-SCEM and ADF-SCEM show similar hourglass shapes, their numerical distributions are quite different: BF-SCEM PSF is always positive and shows a center of symmetry whereas the ADF-SCEM PSF is complex and has Hermitian symmetry. These PSF properties explain the large elongation effect in BF-SCEM for laterally extended object and almost no-elongation in ADF-SCEM, illustrating the importance of the numerical analysis of PSFs. The Hermitian symmetry of the ADF-SCEM PSF results in an interesting "edge enhancement effect" at the interface. Simulation using the PSF and the multislice method verified this effect at GaAs surfaces and InAs interfaces embedded in GaAs. This unique feature of ADF-SCEM can potentially be useful for depth sectioning. It is also pointed out that a PSF imaging model cannot be applicable for BF-SCEM of a phase object, when the system is symmetric and aberration free.

Imaging properties of bright-field and annular-dark-field scanning confocal electron microscopy.

Imaging properties of scanning confocal electron microscopy (SCEM) were studied by calculating simple model systems using the multislice method. A simple geometrical explanation was given, particularly for the difference between bright field (BF) and annular dark field (ADF) SCEM. It is demonstrated that the BF-SCEM image contrast consists of two features. One gradually changes over a wide defocus range and depends on the lateral size of the object. Another appears only near the focus and is independent of sample size. On the contrary, ADF-SCEM image contrast does not depend on the lateral size of the object. Therefore, the ADF-SCEM will provide more readily interpretable image contrast.

Sub-10 nm crystalline silicon nanostructures by electron beam induced deposition lithography.

A novel top-down approach for the controllable fabrication of semiconductor nanostructures exhibiting quantum effects is described. By decomposing metal-rich precursor gas molecules with an electron beam, a sub-10 nm metal pattern can be formed and subsequently transferred to a semiconductor substrate. In such a way monocrystalline silicon nanodots and nanowires are produced as revealed by transmission electron microscopy. It is also shown how through controlled thermal or chemical oxidation the nanostructure surface can be passivated. By providing direct access to the sub-10 nm size range this method possesses promising potential for application in the quantum dot and nanoelectronics fields.

FcepsilonRIalpha gene (FCER1A) promoter polymorphisms and total serum IgE levels in Japanese atopic dermatitis patients.

Two promoter polymorphisms of the high-affinity IgE receptor alpha-subunit (FcepsilonRIalpha) gene (FCER1A), -66T>C (rs2251746) and -315C>T (rs2427827), were analysed in Japanese atopic dermatitis subjects. Patients with the -315CT/TT genotype tended to have higher total serum IgE levels, while the proportion of -315CT/TT genotype or the -315T allele was significantly higher in those with highly elevated total serum IgE concentrations.

A nanosized photodetector fabricated by electron-beam-induced deposition.

A sensitive nanosized molybdenum oxide (MoO(x)) photodetector is manufactured at a desired position by electron-beam-induced deposition (EBID). As-deposited MoO(x) had a conductivity approximately 300 S cm(-1). After 2 h annealing at 573 K, the conductivity of nanowires decreased 10 times to approximately 30 S cm(-1) and MoO(x) had photoconductivity. Nanosized MoO(x) wires enhanced the sensitivity of optical devices due to an increased surface area to volume ratio.

Bloch wave-based calculation of imaging properties of high-resolution scanning confocal electron microscopy.

An efficient, Bloch wave-based method is presented for simulation of high-resolution scanning confocal electron microscopy (SCEM) images. The latter are predicted to have coherent nature, i.e. to exhibit atomic contrast reversals depending on the lens defocus settings and sample thickness. The optimal defocus settings are suggested and the 3D imaging capabilities of SCEM are analyzed in detail. In particular, by monitoring average image intensity as a function of the probe focus depth, it should be possible to accurately measure the depth of a heavy-atom layer embedded in a light-element matrix.

Thickness measurements with electron energy loss spectroscopy.

Measurements of thickness using electron energy loss spectroscopy (EELS) are revised. Absolute thickness values can be quickly and accurately determined with the Kramers-Kronig sum method. The EELS data analysis is even much easier with the log-ratio method, however, absolute calibration of this method requires knowledge of the mean free path of inelastic electron scattering lambda. The latter has been measured here in a wide range of solids and a scaling law lambda approximately rho(-0.3) versus mass density rho has been revealed. EELS measurements critically depend on the excitation and collection angles. This dependence has been studied experimentally and theoretically and an efficient model has been formulated.

High-resolution electron microscopy of detonation nanodiamond.

The structure of individual nanodiamond grains produced by the detonation of carbon-based explosives has been studied with a high-vacuum aberration-corrected electron microscope. Many grains show a well-resolved cubic diamond lattice with negligible contamination, thereby demonstrating that the non-diamond shell, universally observed on nanodiamond particles, could be intrinsic to the preparation process rather than to the nanosized diamond itself. The strength of the adhesion between the nanodiamond grains, and the possibility of their patterning with sub-nanometer precision, are also demonstrated.

The squamous cell carcinoma antigens as relevant biomarkers of atopic dermatitis.

BACKGROUND: Although it is thought that both Th1- and Th2-type inflammations are involved in the pathogenesis of atopic dermatitis (AD), it is controversial which immune response is more involved in regulating the clinical severity of AD. We recently found that the squamous cell carcinoma antigens 1 (SCCA1) and SCCA2 are novel biomarkers of bronchial asthma, downstream of IL-4 and IL-13. OBJECTIVE: We examined whether SCCA1 and SCCA2 could also serve as biomarkers of AD, reflecting its Th2-type immune responses, and whether the expression level of SCCA was correlated with clinical severity of AD. METHOD: We compared the expression of SCCA1 and SCCA2 at the mRNA and protein levels in both involved and uninvolved skin of AD patients and in normal control skin. We next analysed induction of SCCA by IL-4 or IL-13 in keratinocytes. Finally, we compared the serum level of SCCA with laboratory parameters reflecting Th2-type inflammation and clinical severity in AD patients. RESULTS: SCCA1 and SCCA2 were highly expressed in involved skin of AD patients, compared with their uninvolved skin, at both mRNA and protein levels. SCCA protein was dominantly expressed in suprabasal keratinocytes in the epidermis of AD patients. Either IL-4 or IL-13, but not IFN-gamma or TNF, induced production of SCCA in keratinocytes. These result suggest that SCCA is induced in AD skin, probably due to direct actions of IL-4 and/or IL-13 on keratinocytes. Serum levels of SCCA were well correlated with eosinophil numbers and serum lactate dehydrogenase levels, and weakly with serum IgE levels, in AD patients. Furthermore, serum levels of SCCA were strongly correlated with clinical severity. CONCLUSIONS: Th2-type inflammation dominantly regulates the clinical severity of AD, and SCCA is a relevant biomarker of AD, reflecting both Th2-type inflammation and clinical severity.

Dynamic profile calculation of deposition resolution by high-energy electrons in electron-beam-induced deposition.

The effect of the accelerating voltage of incident electrons on the resolution of electron-beam-induced deposition was investigated by a dynamic Monte Carlo profile simulator which includes the electron scattering in the already grown deposit structure. By simulating the deposition at two different accelerating voltages of 20 and 200 kV with an idealistic zero-diameter incident probe on a bulk substrate, it was revealed that the smaller size structures were attainable by 200 keV than by 20 keV. The effect of the substrate was also argued by comparing the above results with the simulation results obtained for a point-like starting substrate. Surprisingly, the shapes of the deposits grown on bulk substrates were reproduced well by the simulations starting from point-like substrates indicating the small effect of the substrate on the shape of deposits.

Observation of nanometer-Xe clusters embedded in Al crystals.

The structure of Xe precipitates with sizes in several nanometers embedded in Al is known to be stable and its structure is well confirmed. But knowledge about the structure of Xe precipitates with nanometer sizes is very limited. There are difficulties in observing such small structures embedded in a crystalline matrix. An off-Bragg condition is used to observe diffraction patterns, dark-field, and high-resolution transmission electron microscopy images. The structure of Xe precipitates with sizes of about 2 nm and smaller is observed and confirmed. They are in an fcc structure and their orientation relationship with the Al matrix is similar to that of larger crystalline Xe precipitates or in an undefined structure. The lattice spacing or atomic distance in such nanometer-sized Xe precipitates is smaller than those of larger Xe precipitates embedded in Al matrix. There is a trend that as the size becomes smaller, the precipitates are more likely to have an undefined structure.

Structure of nanometre-sized Xe particles embedded in Al crystals.

The structure and lattice parameters of Xe particles about 1 nm to about 6 nm in size embedded in Al were investigated with off-Bragg condition high-resolution transmission electron microscopy. An Xe particle about 1 nm in size had different structural properties from those 2-6 nm in sizes. Some 1-nm Xe particles had an face-centred cubic (f.c.c.) structure with the same orientation as the Al matrix, whereas others of the same size had a non-f.c.c. structure. The lattice parameters of a 1-nm f.c.c. Xe particle were about 20% smaller than the average value obtained from electron diffraction, i.e. the particle was compressed by about 80%. The lattice parameters of Xe crystals about 2 nm to about 6 nm in size were almost the same as those obtained from diffraction results. One of the reasons for the extra compression seen with a 1-nm Xe particle is the increase in pressure inside an Xe particle with decreasing particle size.

Possible mechanisms of gender bias in SLE: a new hypothesis involving a comparison of SLE with atopy.

The prevalence of systemic lupus erythematosus (SLE) is far higher in females than in males, and numerous investigations of this gender bias have been performed from several perspectives. Sex hormones, particularly estrogens, may be significant in causing the gender discrepancy. This article discusses the possible importance of estrogens in regulating the expression of and responsivity to autoantigens in SLE and in atopic disorders, which are associated with hyperreactivity to exogenous antigens. Estrogens seem to play an important role in the overexpression of endogenous autoantigens, such as human endogenous retroviruses (HERV), and this may be related to the existence of a gender bias in the incidence of SLE but not atopy.

Application of transmission electron microscopes to nanometre-sized fabrication by means of electron beam-induced deposition.

Electron beam-induced deposition was carried out using a scanning transmission electron microscope with a field emission gun to fabricate nanometre-sized structures. A small amount of a metal-organic gas was introduced near the substrate in the microscope chamber, and focused electron beams were irradiated. Two- and three-dimensional structures were fabricated by scanning the beam position. The minimum line width of the freestanding structures was 8 nm at a constant gas flux used. This line width of 8 nm is considered to be achieved by employing a high accelerating voltage, which leads to a small probe size, and the optimum scanning speed.

Layer-doubling method in ADF-STEM image simulation.

A layer-doubling method developed in LEED calculation is applied to the ADF-STEM image simulation. This approach makes it possible to simulate image intensities of systems having a repeated slab structure, such as embedded precipitates or defects, with a much higher efficiency because it does not require the diagonalization of repeated slabs. As a simple example of this method, channeling effects are calculated for a system with embedded crystalline displaced slabs for various different slab thicknesses.

In situ observation of the formation of Fe3O4 in Fe4N (001) due to electron irradiation.

gamma(')-Fe4N was subjected to electron irradiation with the dose rate of 6.8 x 10(23)e m(-2) s(-1) in a 400 kV transmission electron microscope. The first in situ observation of the formation of Fe3O4 (O) on Fe4N (gamma(')) with the orientation relationship of [100](O) parallel [100](gamma(')) and <001>(O) parallel <001>(gamma(')) has been made inside the microscope with the basic column vacuum of (5-6) x 10(-5) Pa. A mechanism is proposed involving the electron-stimulated dissociation of Fe-N chemical bonds, desorption of nitrogen from the surface, adsorption of oxygen to the surface, and the oxidization of excessive metallic iron on the surface.

Transforming growth factor-beta1 suppresses atopic dermatitis-like skin lesions in NC/Nga mice.

BACKGROUND: Atopic dermatitis is a chronic, relapsing inflammatory disorder characterized by pruritic and eczematous skin lesions. Transforming growth factor (TGF)-beta1 has been implicated in the suppression of inflammatory responses. OBJECTIVE: The purpose of this study is to determine whether TGF-beta1 suppresses skin lesions in a mouse model of atopic dermatitis. METHODS: We used the NC/Nga strain of mice as an in vivo model of atopic dermatitis. The effects of exogenous TGF-beta1 on atopic dermatitis-like skin lesions in NC/Nga mice were evaluated clinically, histologically and immunologically. RESULTS: Subcutaneous injection of recombinant TGF-beta1 macroscopically suppressed eczematous skin lesions in NC/Nga mice associated with reduced serum immunoglobulin E (IgE) levels. Histological analysis showed that TGF-beta1 significantly inhibited the infiltration of inflammatory cells such as mast cells and eosinophils into the skin of NC/Nga mice. Spontaneous interferon (IFN)-gamma production from splenocytes of NC/Nga mice was down-regulated by the treatment with TGF-beta1 and neutralizing antibody against IFN-gamma inhibited skin lesions in NC/Nga mice. The inhibitory effect of TGF-beta1 on the skin lesions lasted at least 1 week after cessation of the treatment. CONCLUSION: These findings indicate that TGF-beta1 suppressed atopic dermatitis-like skin lesions in NC/Nga mice at least in part through down-regulation of IFN-gamma. These results suggest that TGF-beta1 may have a therapeutic potential for atopic dermatitis.

Primary cutaneous nocardiosis with multiple, subcutaneous abscesses in a patient with sarcoidosis.

A case of multiple subcutaneous nocardial abscesses is reported in a patient who received systemic corticosteroids over a period of about 4 years for the treatment of visceral sarcoidosis. The diagnosis of subcutaneous abscess caused by Nocardia asteroides was made based on bacteriological examination. It could not be determined before treatment whether the abscesses represented primary or secondary nocardiosis. Surgical drainage and systemic administration of minocycline hydrochloride dramatically resolved the cutaneous lesions. To the authors' knowledge, this is the first reported case in Japan of primary cutaneous nocardiosis in a patient with sarcoidosis.

New scheme for calculation of annular dark-field STEM image including both elastically diffracted and TDS waves.

A new scheme of calculation of high-angle annular dark-field STEM image, capable of including both elastically diffracted and thermal diffuse scattering waves, has been presented by a combination of Pennycook's and Nakamura's methods. The new scheme has been demonstrated for image simulations of Si(011) as functions of thickness, defocus values and detector angles. In the present method, the TDS electron intensities are treated in the same way as in Pennycook's method, having a clear physical picture of its origin and reflecting the atom configuration in the systems. For the case of Si(011), it has been confirmed that at the detector angle of 60 to 160 mrad, which is usually applied, the image becomes highly incoherent, and even the image formed only from SOLZ beams becomes incoherent at the detector angle. At a low detector angle, however, the image has coherent features indicating the necessity of a simulation for individual systems.